This paper describes a simple elegant design method to realize a built-in multi-mode ICs tester. The designed tester is capable of providing higher level of testability for testing the circuits in BIST environment. The proposed design approach is demonstrated by implementing the multi-mode tester's design on GAL16V8 chip.
|Number of pages||6|
|Journal||IETE Technical Review (Institution of Electronics and Telecommunication Engineers, India)|
|Publication status||Published - Jul 1998|
ASJC Scopus subject areas
- Electrical and Electronic Engineering