Design of a Built-in Multi-mode ICs Tester with Higher Testability Features - A most Suitable Testing Tool for BIST Environment

Afaq Ahmad, Amer H. Al-Habsi

Research output: Contribution to journalArticle

3 Citations (Scopus)


This paper describes a simple elegant design method to realize a built-in multi-mode ICs tester. The designed tester is capable of providing higher level of testability for testing the circuits in BIST environment. The proposed design approach is demonstrated by implementing the multi-mode tester's design on GAL16V8 chip.

Original languageEnglish
Pages (from-to)283-288
Number of pages6
JournalIETE Technical Review (Institution of Electronics and Telecommunication Engineers, India)
Issue number4
Publication statusPublished - Jul 1998


ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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