TY - JOUR
T1 - Design of a built-in multi-mode ICs tester with higher testability features- a most suitable testing tool for BIST environment
T2 - Reprint
AU - Ahmad, Afaq
AU - Al-Habsi, Amer
PY - 2015/3/26
Y1 - 2015/3/26
N2 - This paper describes a simple elegant design method to realize a built-in multi-mode ICs tester. The designed tester is capable of providing higher level of testability for testing the circuits in BIST environment. The proposed design approach is demonstrated by implementing the multi-mode tester's design on GAL16V8 chip.
AB - This paper describes a simple elegant design method to realize a built-in multi-mode ICs tester. The designed tester is capable of providing higher level of testability for testing the circuits in BIST environment. The proposed design approach is demonstrated by implementing the multi-mode tester's design on GAL16V8 chip.
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U2 - 10.1080/02564602.1998.11416760
DO - 10.1080/02564602.1998.11416760
M3 - Article
AN - SCOPUS:0032107933
SN - 0256-4602
VL - 15
SP - 283
EP - 288
JO - IETE Technical Review (Institution of Electronics and Telecommunication Engineers, India)
JF - IETE Technical Review (Institution of Electronics and Telecommunication Engineers, India)
IS - 4
ER -