Design of a Built-in Multi-mode ICs Tester with Higher Testability Features - A most Suitable Testing Tool for BIST Environment

Afaq Ahmad*, Amer H. Al-Habsi

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Fingerprint Dive into the research topics of 'Design of a Built-in Multi-mode ICs Tester with Higher Testability Features - A most Suitable Testing Tool for BIST Environment'. Together they form a unique fingerprint.

Engineering & Materials Science