What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)710-717
Number of pages8
JournalOriental journal of computer science and technology
Volume10
Issue number4
DOIs
Publication statusPublished - 2017

Cite this

@article{505b4c9050e84168bbb07ac318697e6a,
title = "What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology",
author = "Afaq Ahmad and Dawood Al-Abri and Sameer Al-Busaidi and {M. Bait-Suwailam}, Mohammed",
year = "2017",
doi = "http://dx.doi.org/10.13005/ojcst/10.04.02",
language = "English",
volume = "10",
pages = "710--717",
journal = "Oriental journal of computer science and technology",
issn = "0974-6471",
number = "4",

}

TY - JOUR

T1 - What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology

AU - Ahmad, Afaq

AU - Al-Abri, Dawood

AU - Al-Busaidi, Sameer

AU - M. Bait-Suwailam, Mohammed

PY - 2017

Y1 - 2017

U2 - http://dx.doi.org/10.13005/ojcst/10.04.02

DO - http://dx.doi.org/10.13005/ojcst/10.04.02

M3 - Article

VL - 10

SP - 710

EP - 717

JO - Oriental journal of computer science and technology

JF - Oriental journal of computer science and technology

SN - 0974-6471

IS - 4

ER -