What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)710-717
Number of pages8
JournalOriental journal of computer science and technology
Volume10
Issue number4
DOIs
Publication statusPublished - 2017

Cite this