What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology

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Original language	English
Pages (from-to)	710-717
Number of pages	8
Journal	Oriental journal of computer science and technology
Volume	10
Issue number	4
DOIs	https://doi.org/10.13005/ojcst/10.04.02
Publication status	Published - 2017

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title = "What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology",

author = "Afaq Ahmad and Dawood Al-Abri and Sameer Al-Busaidi and {M. Bait-Suwailam}, Mohammed",

year = "2017",

doi = "http://dx.doi.org/10.13005/ojcst/10.04.02",

language = "English",

volume = "10",

pages = "710--717",

journal = "Oriental journal of computer science and technology",

issn = "0974-6471",

number = "4",

}

TY - JOUR

T1 - What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology

AU - Ahmad, Afaq

AU - Al-Abri, Dawood

AU - Al-Busaidi, Sameer

AU - M. Bait-Suwailam, Mohammed

PY - 2017

Y1 - 2017

U2 - http://dx.doi.org/10.13005/ojcst/10.04.02

DO - http://dx.doi.org/10.13005/ojcst/10.04.02

M3 - Article

SN - 0974-6471

VL - 10

SP - 710

EP - 717

JO - Oriental journal of computer science and technology

JF - Oriental journal of computer science and technology

IS - 4

ER -