What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology

نتاج البحث: المساهمة في مجلة › Article › مراجعة النظراء

اللغة الأصلية	English
الصفحات (من إلى)	710-717
عدد الصفحات	8
دورية	Oriental journal of computer science and technology
مستوى الصوت	10
رقم الإصدار	4
المعرِّفات الرقمية للأشياء	https://doi.org/10.13005/ojcst/10.04.02
حالة النشر	Published - 2017

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نتاج البحث: المساهمة في مجلة › Article › مراجعة النظراء

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title = "What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology",

author = "Afaq Ahmad and Dawood Al-Abri and Sameer Al-Busaidi and {M. Bait-Suwailam}, Mohammed",

year = "2017",

doi = "http://dx.doi.org/10.13005/ojcst/10.04.02",

language = "English",

volume = "10",

pages = "710--717",

journal = "Oriental journal of computer science and technology",

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T1 - What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology

AU - Ahmad, Afaq

AU - Al-Abri, Dawood

AU - Al-Busaidi, Sameer

AU - M. Bait-Suwailam, Mohammed

PY - 2017

Y1 - 2017

U2 - http://dx.doi.org/10.13005/ojcst/10.04.02

DO - http://dx.doi.org/10.13005/ojcst/10.04.02

M3 - Article

SN - 0974-6471

VL - 10

SP - 710

EP - 717

JO - Oriental journal of computer science and technology

JF - Oriental journal of computer science and technology

IS - 4

ER -