Shift register modification for multipurpose use in combinational circuit testing

N. K. Nanda; A. Ahmad; V. C. Gaindhar

doi:10.1080/00207218908925441

Shift register modification for multipurpose use in combinational circuit testing

N. K. Nanda, A. Ahmad, V. C. Gaindhar

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

By modifying the shift registers of the commonly used built-in self-test (BIST) scheme, an effective multipurpose testing tool has been realized. The tool is capable of providing maximum enhancement in fault-cover, as well as significant improvement in error coverage.

Original language	English
Pages (from-to)	875-878
Number of pages	4
Journal	International Journal of Electronics
Volume	66
Issue number	6
DOIs	https://doi.org/10.1080/00207218908925441
Publication status	Published - Jun 1989
Externally published	Yes

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1080/00207218908925441

Cite this

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title = "Shift register modification for multipurpose use in combinational circuit testing",

abstract = "By modifying the shift registers of the commonly used built-in self-test (BIST) scheme, an effective multipurpose testing tool has been realized. The tool is capable of providing maximum enhancement in fault-cover, as well as significant improvement in error coverage.",

author = "Nanda, {N. K.} and A. Ahmad and Gaindhar, {V. C.}",

year = "1989",

month = jun,

doi = "10.1080/00207218908925441",

language = "English",

volume = "66",

pages = "875--878",

journal = "International Journal of Electronics",

issn = "0020-7217",

publisher = "Taylor and Francis Ltd.",

number = "6",

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T1 - Shift register modification for multipurpose use in combinational circuit testing

AU - Nanda, N. K.

AU - Ahmad, A.

AU - Gaindhar, V. C.

PY - 1989/6

Y1 - 1989/6

N2 - By modifying the shift registers of the commonly used built-in self-test (BIST) scheme, an effective multipurpose testing tool has been realized. The tool is capable of providing maximum enhancement in fault-cover, as well as significant improvement in error coverage.

AB - By modifying the shift registers of the commonly used built-in self-test (BIST) scheme, an effective multipurpose testing tool has been realized. The tool is capable of providing maximum enhancement in fault-cover, as well as significant improvement in error coverage.

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U2 - 10.1080/00207218908925441

DO - 10.1080/00207218908925441

M3 - Article

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VL - 66

SP - 875

EP - 878

JO - International Journal of Electronics

JF - International Journal of Electronics

IS - 6

ER -

Shift register modification for multipurpose use in combinational circuit testing

Abstract

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