Abstract
By modifying the shift registers of the commonly used built-in self-test (BIST) scheme, an effective multipurpose testing tool has been realized. The tool is capable of providing maximum enhancement in fault-cover, as well as significant improvement in error coverage.
Original language | English |
---|---|
Pages (from-to) | 875-878 |
Number of pages | 4 |
Journal | International Journal of Electronics |
Volume | 66 |
Issue number | 6 |
DOIs | |
Publication status | Published - Jun 1989 |
Externally published | Yes |
ASJC Scopus subject areas
- Electrical and Electronic Engineering