Shift register modification for multipurpose use in combinational circuit testing

N. K. Nanda, A. Ahmad, V. C. Gaindhar

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

By modifying the shift registers of the commonly used built-in self-test (BIST) scheme, an effective multipurpose testing tool has been realized. The tool is capable of providing maximum enhancement in fault-cover, as well as significant improvement in error coverage.

Original languageEnglish
Pages (from-to)875-878
Number of pages4
JournalInternational Journal of Electronics
Volume66
Issue number6
DOIs
Publication statusPublished - 1989

Fingerprint

Combinatorial circuits
Shift registers
Built-in self test
Testing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Shift register modification for multipurpose use in combinational circuit testing. / Nanda, N. K.; Ahmad, A.; Gaindhar, V. C.

In: International Journal of Electronics, Vol. 66, No. 6, 1989, p. 875-878.

Research output: Contribution to journalArticle

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