Shift register modification for multipurpose use in combinational circuit testing

N. K. Nanda, A. Ahmad, V. C. Gaindhar

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

By modifying the shift registers of the commonly used built-in self-test (BIST) scheme, an effective multipurpose testing tool has been realized. The tool is capable of providing maximum enhancement in fault-cover, as well as significant improvement in error coverage.

Original languageEnglish
Pages (from-to)875-878
Number of pages4
JournalInternational Journal of Electronics
Volume66
Issue number6
DOIs
Publication statusPublished - 1989

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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