Probing anodic oxidation kinetics and nanoscale heterogeneity within TiO2 films by Conductive Atomic Force Microscopy and combined techniques

M. V. Diamanti, T. Souier, M. Stefancich, M. Chiesa, M. P. Pedeferri

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Anodic oxidation of titanium in acid electrolytes allows to obtain a thin, compact oxide layer with thickness, structure, color, and electrical properties that vary with process parameters imposed, among which cell voltage has a key effect. Although oxidation kinetics have been investigated in several research works, a broader vision of oxide properties-including thickness and structure-still has to be achieved, especially in the case of very thin oxide films, few tens of nanometers thick. This is vital for engineered applications of nanostructured TiO2 films, as in the field of memristive devices, where a precise control of oxide thickness, composition and structure is required to tune its electrical response. In this work, oxide films were produced on titanium with thickness ranging from few nanometers to 200 nm. Oxide thickness was estimated by coulometry and spectrophotometry. These techniques were then combined with C-AFM, which provided a deeper understanding of oxide thickness and uniformity of the metal surface and probed the presence of crystalline nano-domains within the amorphous oxide phase affecting the overall film electrical and optical properties.

Original languageEnglish
Pages (from-to)203-210
Number of pages8
JournalElectrochimica Acta
Volume129
DOIs
Publication statusPublished - May 20 2014

Fingerprint

Anodic oxidation
Oxides
Atomic force microscopy
Kinetics
Titanium
Oxide films
Electric properties
Coulometers
Spectrophotometry
Electrolytes
Optical properties
Metals
Crystalline materials
Color
Thin films
Oxidation
Acids
Electric potential
Chemical analysis

Keywords

  • anodizing
  • conductivity
  • memristor
  • nanoscale
  • titanium oxide

ASJC Scopus subject areas

  • Chemical Engineering(all)
  • Electrochemistry

Cite this

Probing anodic oxidation kinetics and nanoscale heterogeneity within TiO2 films by Conductive Atomic Force Microscopy and combined techniques. / Diamanti, M. V.; Souier, T.; Stefancich, M.; Chiesa, M.; Pedeferri, M. P.

In: Electrochimica Acta, Vol. 129, 20.05.2014, p. 203-210.

Research output: Contribution to journalArticle

@article{335f2f5b100f430f81a4de8feb36f893,
title = "Probing anodic oxidation kinetics and nanoscale heterogeneity within TiO2 films by Conductive Atomic Force Microscopy and combined techniques",
abstract = "Anodic oxidation of titanium in acid electrolytes allows to obtain a thin, compact oxide layer with thickness, structure, color, and electrical properties that vary with process parameters imposed, among which cell voltage has a key effect. Although oxidation kinetics have been investigated in several research works, a broader vision of oxide properties-including thickness and structure-still has to be achieved, especially in the case of very thin oxide films, few tens of nanometers thick. This is vital for engineered applications of nanostructured TiO2 films, as in the field of memristive devices, where a precise control of oxide thickness, composition and structure is required to tune its electrical response. In this work, oxide films were produced on titanium with thickness ranging from few nanometers to 200 nm. Oxide thickness was estimated by coulometry and spectrophotometry. These techniques were then combined with C-AFM, which provided a deeper understanding of oxide thickness and uniformity of the metal surface and probed the presence of crystalline nano-domains within the amorphous oxide phase affecting the overall film electrical and optical properties.",
keywords = "anodizing, conductivity, memristor, nanoscale, titanium oxide",
author = "Diamanti, {M. V.} and T. Souier and M. Stefancich and M. Chiesa and Pedeferri, {M. P.}",
year = "2014",
month = "5",
day = "20",
doi = "10.1016/j.electacta.2014.02.098",
language = "English",
volume = "129",
pages = "203--210",
journal = "Electrochimica Acta",
issn = "0013-4686",
publisher = "Elsevier Limited",

}

TY - JOUR

T1 - Probing anodic oxidation kinetics and nanoscale heterogeneity within TiO2 films by Conductive Atomic Force Microscopy and combined techniques

AU - Diamanti, M. V.

AU - Souier, T.

AU - Stefancich, M.

AU - Chiesa, M.

AU - Pedeferri, M. P.

PY - 2014/5/20

Y1 - 2014/5/20

N2 - Anodic oxidation of titanium in acid electrolytes allows to obtain a thin, compact oxide layer with thickness, structure, color, and electrical properties that vary with process parameters imposed, among which cell voltage has a key effect. Although oxidation kinetics have been investigated in several research works, a broader vision of oxide properties-including thickness and structure-still has to be achieved, especially in the case of very thin oxide films, few tens of nanometers thick. This is vital for engineered applications of nanostructured TiO2 films, as in the field of memristive devices, where a precise control of oxide thickness, composition and structure is required to tune its electrical response. In this work, oxide films were produced on titanium with thickness ranging from few nanometers to 200 nm. Oxide thickness was estimated by coulometry and spectrophotometry. These techniques were then combined with C-AFM, which provided a deeper understanding of oxide thickness and uniformity of the metal surface and probed the presence of crystalline nano-domains within the amorphous oxide phase affecting the overall film electrical and optical properties.

AB - Anodic oxidation of titanium in acid electrolytes allows to obtain a thin, compact oxide layer with thickness, structure, color, and electrical properties that vary with process parameters imposed, among which cell voltage has a key effect. Although oxidation kinetics have been investigated in several research works, a broader vision of oxide properties-including thickness and structure-still has to be achieved, especially in the case of very thin oxide films, few tens of nanometers thick. This is vital for engineered applications of nanostructured TiO2 films, as in the field of memristive devices, where a precise control of oxide thickness, composition and structure is required to tune its electrical response. In this work, oxide films were produced on titanium with thickness ranging from few nanometers to 200 nm. Oxide thickness was estimated by coulometry and spectrophotometry. These techniques were then combined with C-AFM, which provided a deeper understanding of oxide thickness and uniformity of the metal surface and probed the presence of crystalline nano-domains within the amorphous oxide phase affecting the overall film electrical and optical properties.

KW - anodizing

KW - conductivity

KW - memristor

KW - nanoscale

KW - titanium oxide

UR - http://www.scopus.com/inward/record.url?scp=84897896270&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84897896270&partnerID=8YFLogxK

U2 - 10.1016/j.electacta.2014.02.098

DO - 10.1016/j.electacta.2014.02.098

M3 - Article

AN - SCOPUS:84897896270

VL - 129

SP - 203

EP - 210

JO - Electrochimica Acta

JF - Electrochimica Acta

SN - 0013-4686

ER -