Probing anodic oxidation kinetics and nanoscale heterogeneity within TiO2 films by Conductive Atomic Force Microscopy and combined techniques

M. V. Diamanti*, T. Souier, M. Stefancich, M. Chiesa, M. P. Pedeferri

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

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