New algorithmic procedure to test m-sequence generating feedback connections of stream Cipher's LFSRs

A. Ahmad, S. Al-Busaidi, M. J. Al-Mushrafi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

This paper presents a new algorithmic procedure for testing the feedback connections of an LFSR to check whether the design may generate maximal length sequences (m-sequence) or not. Since for an n-bit LFSR the algorithm only requires an (n-1) - bit register operation through out its entire implementation thus, it requires minimal CPU time as well as memory space. Therefore, the attribute of the developed algorithm is two folded. The first, it is the fastest available algorithm and secondly, it is not posing the restriction on the length of the LFSRs like other existing methods. The simulation result of the algorithm is compared with the results of existing algorithms and found much faster than the other existing algorithms. The implementation procedure of the algorithm is demonstrated through an elaborative example.

Original languageEnglish
Title of host publicationIEEE Region 10 International Conference on Electrical and Electronic Technology
EditorsD. Tien, Y.C. Liang, D. Tien, Y.C. Liang
Pages366-369
Number of pages4
Publication statusPublished - 2001
EventIEEE Region 10 International Conference on Electrical and Electronic Technology - Singapore, Singapore
Duration: Aug 19 2001Aug 22 2001

Other

OtherIEEE Region 10 International Conference on Electrical and Electronic Technology
CountrySingapore
CitySingapore
Period8/19/018/22/01

Keywords

  • Feedback connections
  • LFSR
  • M-sequence
  • Primitive polynomial

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Ahmad, A., Al-Busaidi, S., & Al-Mushrafi, M. J. (2001). New algorithmic procedure to test m-sequence generating feedback connections of stream Cipher's LFSRs. In D. Tien, Y. C. Liang, D. Tien, & Y. C. Liang (Eds.), IEEE Region 10 International Conference on Electrical and Electronic Technology (pp. 366-369)