Magnetic anisotropy in ilmenite-hematite solid solution thin films grown by pulsed laser ablation

K. Rode, R. D. Gunning, R. G S Sofin, M. Venkatesan, J. G. Lunney, J. M D Coey, I. V. Shvets

Research output: Contribution to journalArticle

11 Citations (Scopus)


Ferromagnetic thin films of the ilmenite-hematite solid solution Fe2-xTixO3 with x=0.6 and x=0.8 have been grown on (0 0 1) sapphire substrates. X-ray diffraction analysis reveals that the films are single phase with the ilmenite (R over(3, -)) crystal structure. Strong easy-plane anisotropy is observed for the two films, which are nominally n or p type with K1=-8×106 J m-3 for x=0.6 and -11×106 J m-3 for x=0.8 at T=4 K. The trigonal splitting of the 5T2g energy level of Fe2+ is inferred to be 0.11 eV, and the zero-field splitting parameter D to be equal to 15 K.

Original languageEnglish
Pages (from-to)3238-3241
Number of pages4
JournalJournal of Magnetism and Magnetic Materials
Issue number23
Publication statusPublished - Dec 2008



  • Epitaxial film
  • Ferrimagnetics
  • Hematite
  • Ilmenite
  • Magnetic anisotropy
  • Magnetic semiconductors
  • Pulsed laser ablation
  • Spin electronics

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

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