Abstract
Ferromagnetic thin films of the ilmenite-hematite solid solution Fe2-xTixO3 with x=0.6 and x=0.8 have been grown on (0 0 1) sapphire substrates. X-ray diffraction analysis reveals that the films are single phase with the ilmenite (R over(3, -)) crystal structure. Strong easy-plane anisotropy is observed for the two films, which are nominally n or p type with K1=-8×106 J m-3 for x=0.6 and -11×106 J m-3 for x=0.8 at T=4 K. The trigonal splitting of the 5T2g energy level of Fe2+ is inferred to be 0.11 eV, and the zero-field splitting parameter D to be equal to 15 K.
Original language | English |
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Pages (from-to) | 3238-3241 |
Number of pages | 4 |
Journal | Journal of Magnetism and Magnetic Materials |
Volume | 320 |
Issue number | 23 |
DOIs | |
Publication status | Published - Dec 2008 |
Externally published | Yes |
Keywords
- Epitaxial film
- Ferrimagnetics
- Hematite
- Ilmenite
- Magnetic anisotropy
- Magnetic semiconductors
- Pulsed laser ablation
- Spin electronics
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics