Critical role of primitive polynomials in an lfsr based testing technique

A. Ahmad; N. K. Nanda; K. Garg

doi:10.1049/el:19880649

Critical role of primitive polynomials in an lfsr based testing technique

A. Ahmad, N. K. Nanda, K. Garg

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

The results of a simulation of an LFSR-based testing technique show that when the characteristic polynomials used in the test pattern generator, as well as in the signature analyser, are primitive and reciprocal to each other then maximum aliasing errors occur.

Original language	English
Pages (from-to)	953-955
Number of pages	3
Journal	Electronics Letters
Volume	24
Issue number	15
DOIs	https://doi.org/10.1049/el:19880649
Publication status	Published - 1988
Externally published	Yes

Keywords

Aliasing
Logic and logic design
Logic devices
Shift registers

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1049/el:19880649

Cite this

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title = "Critical role of primitive polynomials in an lfsr based testing technique",

abstract = "The results of a simulation of an LFSR-based testing technique show that when the characteristic polynomials used in the test pattern generator, as well as in the signature analyser, are primitive and reciprocal to each other then maximum aliasing errors occur.",

keywords = "Aliasing, Logic and logic design, Logic devices, Shift registers",

author = "A. Ahmad and Nanda, {N. K.} and K. Garg",

year = "1988",

doi = "10.1049/el:19880649",

language = "English",

volume = "24",

pages = "953--955",

journal = "Electronics Letters",

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T1 - Critical role of primitive polynomials in an lfsr based testing technique

AU - Ahmad, A.

AU - Nanda, N. K.

AU - Garg, K.

PY - 1988

Y1 - 1988

N2 - The results of a simulation of an LFSR-based testing technique show that when the characteristic polynomials used in the test pattern generator, as well as in the signature analyser, are primitive and reciprocal to each other then maximum aliasing errors occur.

AB - The results of a simulation of an LFSR-based testing technique show that when the characteristic polynomials used in the test pattern generator, as well as in the signature analyser, are primitive and reciprocal to each other then maximum aliasing errors occur.

KW - Aliasing

KW - Logic and logic design

KW - Logic devices

KW - Shift registers

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DO - 10.1049/el:19880649

M3 - Article

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EP - 955

JO - Electronics Letters

JF - Electronics Letters

IS - 15

ER -

Critical role of primitive polynomials in an lfsr based testing technique

Abstract

Keywords

ASJC Scopus subject areas

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