Transmission electron microscope radiation damage of 4H and 6H SiC studied by photoluminescence spectroscopy

J. W. Steeds, G. A. Evans, L. R. Danks, S. Furkert, W. Voegeli, M. M. Ismail, F. Carosella

Research output: Contribution to journal › Article › peer-review

71 Citations (Scopus)

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Physics