Abstract
There are several algorithms for fault diagnosis of digital systems which are used throughout academic and industrial environments. Among those algorithms, TMEAS and SCOAP find particular appeal because of their simplicity in calculating testability of a given digital circuit and in imparting useful information to test engineers regarding the test-locations most vulnerable to occurrence of stuck-at-zero and stuck-at-one faults. In this paper, we have presented summary of TMEAS and SCOAP techniques and then presented results of simulations based on these techniques using a software developed by us. Testability calculations, using the developed software, for a few test circuits are also outlined.
| Original language | English |
|---|---|
| Title of host publication | Conference Proceedings - IEEE SOUTHEASTCON |
| DOIs | |
| Publication status | Published - 2013 |
| Event | IEEE SoutheastCon 2013: Moving America into the Future - Jacksonville, FL, United States Duration: Apr 4 2013 → Apr 7 2013 |
Other
| Other | IEEE SoutheastCon 2013: Moving America into the Future |
|---|---|
| Country | United States |
| City | Jacksonville, FL |
| Period | 4/4/13 → 4/7/13 |
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Keywords
- digital circuit
- digital system
- fault-diagnosis
- SCOAP
- testability
- TMEAS
ASJC Scopus subject areas
- Computer Networks and Communications
- Software
- Electrical and Electronic Engineering
- Control and Systems Engineering
- Signal Processing
Cite this
Transcription of algorithms used for fault-diagnosis of digital systems into computer programs. / Jamil, Tariq; Mohammed, Iftaquaruddin.
Conference Proceedings - IEEE SOUTHEASTCON. 2013. 6567503.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Transcription of algorithms used for fault-diagnosis of digital systems into computer programs
AU - Jamil, Tariq
AU - Mohammed, Iftaquaruddin
PY - 2013
Y1 - 2013
N2 - There are several algorithms for fault diagnosis of digital systems which are used throughout academic and industrial environments. Among those algorithms, TMEAS and SCOAP find particular appeal because of their simplicity in calculating testability of a given digital circuit and in imparting useful information to test engineers regarding the test-locations most vulnerable to occurrence of stuck-at-zero and stuck-at-one faults. In this paper, we have presented summary of TMEAS and SCOAP techniques and then presented results of simulations based on these techniques using a software developed by us. Testability calculations, using the developed software, for a few test circuits are also outlined.
AB - There are several algorithms for fault diagnosis of digital systems which are used throughout academic and industrial environments. Among those algorithms, TMEAS and SCOAP find particular appeal because of their simplicity in calculating testability of a given digital circuit and in imparting useful information to test engineers regarding the test-locations most vulnerable to occurrence of stuck-at-zero and stuck-at-one faults. In this paper, we have presented summary of TMEAS and SCOAP techniques and then presented results of simulations based on these techniques using a software developed by us. Testability calculations, using the developed software, for a few test circuits are also outlined.
KW - digital circuit
KW - digital system
KW - fault-diagnosis
KW - SCOAP
KW - testability
KW - TMEAS
UR - http://www.scopus.com/inward/record.url?scp=84883213724&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84883213724&partnerID=8YFLogxK
U2 - 10.1109/SECON.2013.6567503
DO - 10.1109/SECON.2013.6567503
M3 - Conference contribution
AN - SCOPUS:84883213724
SN - 9781479900527
BT - Conference Proceedings - IEEE SOUTHEASTCON
ER -