Abstract
There are several algorithms for fault diagnosis of digital systems which are used throughout academic and industrial environments. Among those algorithms, TMEAS and SCOAP find particular appeal because of their simplicity in calculating testability of a given digital circuit and in imparting useful information to test engineers regarding the test-locations most vulnerable to occurrence of stuck-at-zero and stuck-at-one faults. In this paper, we have presented summary of TMEAS and SCOAP techniques and then presented results of simulations based on these techniques using a software developed by us. Testability calculations, using the developed software, for a few test circuits are also outlined.
| Original language | English |
|---|---|
| Title of host publication | Conference Proceedings - IEEE SOUTHEASTCON |
| DOIs | |
| Publication status | Published - 2013 |
| Event | IEEE SoutheastCon 2013: Moving America into the Future - Jacksonville, FL, United States Duration: Apr 4 2013 → Apr 7 2013 |
Other
| Other | IEEE SoutheastCon 2013: Moving America into the Future |
|---|---|
| Country | United States |
| City | Jacksonville, FL |
| Period | 4/4/13 → 4/7/13 |
Keywords
- digital circuit
- digital system
- fault-diagnosis
- SCOAP
- testability
- TMEAS
ASJC Scopus subject areas
- Computer Networks and Communications
- Software
- Electrical and Electronic Engineering
- Control and Systems Engineering
- Signal Processing
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Cite this
Jamil, T., & Mohammed, I. (2013). Transcription of algorithms used for fault-diagnosis of digital systems into computer programs. In Conference Proceedings - IEEE SOUTHEASTCON [6567503] https://doi.org/10.1109/SECON.2013.6567503