Transcription of algorithms used for fault-diagnosis of digital systems into computer programs

Tariq Jamil, Iftaquaruddin Mohammed

Research output: Chapter in Book/Report/Conference proceedingConference contribution


There are several algorithms for fault diagnosis of digital systems which are used throughout academic and industrial environments. Among those algorithms, TMEAS and SCOAP find particular appeal because of their simplicity in calculating testability of a given digital circuit and in imparting useful information to test engineers regarding the test-locations most vulnerable to occurrence of stuck-at-zero and stuck-at-one faults. In this paper, we have presented summary of TMEAS and SCOAP techniques and then presented results of simulations based on these techniques using a software developed by us. Testability calculations, using the developed software, for a few test circuits are also outlined.

Original languageEnglish
Title of host publicationIEEE SoutheastCon 2013
Subtitle of host publicationMoving America into the Future
Publication statusPublished - 2013
Externally publishedYes
EventIEEE SoutheastCon 2013: Moving America into the Future - Jacksonville, FL, United States
Duration: Apr 4 2013Apr 7 2013

Publication series

NameConference Proceedings - IEEE SOUTHEASTCON
ISSN (Print)0734-7502


OtherIEEE SoutheastCon 2013: Moving America into the Future
Country/TerritoryUnited States
CityJacksonville, FL


  • digital circuit
  • digital system
  • fault-diagnosis
  • testability

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Software
  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Signal Processing


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