Transcription of algorithms used for fault-diagnosis of digital systems into computer programs

Tariq Jamil; Iftaquaruddin Mohammed

doi:10.1109/SECON.2013.6567503

Transcription of algorithms used for fault-diagnosis of digital systems into computer programs

Tariq Jamil, Iftaquaruddin Mohammed

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

There are several algorithms for fault diagnosis of digital systems which are used throughout academic and industrial environments. Among those algorithms, TMEAS and SCOAP find particular appeal because of their simplicity in calculating testability of a given digital circuit and in imparting useful information to test engineers regarding the test-locations most vulnerable to occurrence of stuck-at-zero and stuck-at-one faults. In this paper, we have presented summary of TMEAS and SCOAP techniques and then presented results of simulations based on these techniques using a software developed by us. Testability calculations, using the developed software, for a few test circuits are also outlined.

Original language	English
Title of host publication	Conference Proceedings - IEEE SOUTHEASTCON
DOIs	https://doi.org/10.1109/SECON.2013.6567503
Publication status	Published - 2013
Event	IEEE SoutheastCon 2013: Moving America into the Future - Jacksonville, FL, United States Duration: Apr 4 2013 → Apr 7 2013

Other

Other	IEEE SoutheastCon 2013: Moving America into the Future
Country	United States
City	Jacksonville, FL
Period	4/4/13 → 4/7/13

Keywords

digital circuit
digital system
fault-diagnosis
SCOAP
testability
TMEAS

ASJC Scopus subject areas

Computer Networks and Communications
Software
Electrical and Electronic Engineering
Control and Systems Engineering
Signal Processing

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10.1109/SECON.2013.6567503

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Cite this

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title = "Transcription of algorithms used for fault-diagnosis of digital systems into computer programs",

abstract = "There are several algorithms for fault diagnosis of digital systems which are used throughout academic and industrial environments. Among those algorithms, TMEAS and SCOAP find particular appeal because of their simplicity in calculating testability of a given digital circuit and in imparting useful information to test engineers regarding the test-locations most vulnerable to occurrence of stuck-at-zero and stuck-at-one faults. In this paper, we have presented summary of TMEAS and SCOAP techniques and then presented results of simulations based on these techniques using a software developed by us. Testability calculations, using the developed software, for a few test circuits are also outlined.",

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doi = "10.1109/SECON.2013.6567503",

language = "English",

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note = "IEEE SoutheastCon 2013: Moving America into the Future ; Conference date: 04-04-2013 Through 07-04-2013",

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AB - There are several algorithms for fault diagnosis of digital systems which are used throughout academic and industrial environments. Among those algorithms, TMEAS and SCOAP find particular appeal because of their simplicity in calculating testability of a given digital circuit and in imparting useful information to test engineers regarding the test-locations most vulnerable to occurrence of stuck-at-zero and stuck-at-one faults. In this paper, we have presented summary of TMEAS and SCOAP techniques and then presented results of simulations based on these techniques using a software developed by us. Testability calculations, using the developed software, for a few test circuits are also outlined.

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KW - fault-diagnosis

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