Thermal activation Eyring energy approach to characterise the dependence of nanoscale friction on the surface roughness

J. Umer; F. Saleem; M. Asim; M. Usman; M. S. Kamran; K. Alam; M. Mohammadpour

doi:10.1016/j.triboint.2020.106532

Thermal activation Eyring energy approach to characterise the dependence of nanoscale friction on the surface roughness

J. Umer^*, F. Saleem, M. Asim, M. Usman, M. S. Kamran, K. Alam, M. Mohammadpour

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

Atomic Force Microscope (AFM) is used to characterise the frictional response of surfaces with varying roughness parameters in dry and in the presence of fully formulated lubricants. The surface roughness has shown to affect nanoscale friction. The characteristics involved the investigation of roughness, small-scale adhesive forces and nanoscale friction using AFM in lateral force mode. The fluid-cell Lateral Force Microscopy (LFM) results were used to model thermal activation Eyring energy components in conjunction with the relevant continuum contact mechanics model. The paper shows that a combination of LFM, for dry and fluid-cell LFM and thermal activation Eyring energy barrier approach is a useful tool to explain the effect of surface roughness on nanoscale friction.

Original language	English
Article number	106532
Journal	Tribology International
Volume	151
DOIs	https://doi.org/10.1016/j.triboint.2020.106532
Publication status	Published - Nov 2020
Externally published	Yes

Keywords

Eyring energy
Fluid cell LFM
Friction
Roughness

ASJC Scopus subject areas

Mechanics of Materials
Mechanical Engineering
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/j.triboint.2020.106532

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title = "Thermal activation Eyring energy approach to characterise the dependence of nanoscale friction on the surface roughness",

abstract = "Atomic Force Microscope (AFM) is used to characterise the frictional response of surfaces with varying roughness parameters in dry and in the presence of fully formulated lubricants. The surface roughness has shown to affect nanoscale friction. The characteristics involved the investigation of roughness, small-scale adhesive forces and nanoscale friction using AFM in lateral force mode. The fluid-cell Lateral Force Microscopy (LFM) results were used to model thermal activation Eyring energy components in conjunction with the relevant continuum contact mechanics model. The paper shows that a combination of LFM, for dry and fluid-cell LFM and thermal activation Eyring energy barrier approach is a useful tool to explain the effect of surface roughness on nanoscale friction.",

keywords = "Eyring energy, Fluid cell LFM, Friction, Roughness",

author = "J. Umer and F. Saleem and M. Asim and M. Usman and Kamran, {M. S.} and K. Alam and M. Mohammadpour",

note = "Funding Information: The first author acknowledges the financial support provided to him by the University of Engineering and Technology Lahore under the faculty development programme to conduct this research at Loughborough University. The use of Atomic Force Microscope at the Woflson School of Mechanical, Electrical and Manufacturing engineering, Loughborough University is also acknowledged. Funding Information: The first author acknowledges the financial support provided to him by the University of Engineering and Technology Lahore under the faculty development programme to conduct this research at Loughborough University . The use of Atomic Force Microscope at the Woflson School of Mechanical, Electrical and Manufacturing engineering, Loughborough University is also acknowledged. Publisher Copyright: {\textcopyright} 2020 Elsevier Ltd",

year = "2020",

month = nov,

doi = "10.1016/j.triboint.2020.106532",

language = "English",

volume = "151",

journal = "Tribology International",

issn = "0301-679X",

publisher = "Elsevier Inc.",

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T1 - Thermal activation Eyring energy approach to characterise the dependence of nanoscale friction on the surface roughness

AU - Umer, J.

AU - Saleem, F.

AU - Asim, M.

AU - Usman, M.

AU - Kamran, M. S.

AU - Alam, K.

AU - Mohammadpour, M.

N1 - Funding Information: The first author acknowledges the financial support provided to him by the University of Engineering and Technology Lahore under the faculty development programme to conduct this research at Loughborough University. The use of Atomic Force Microscope at the Woflson School of Mechanical, Electrical and Manufacturing engineering, Loughborough University is also acknowledged. Funding Information: The first author acknowledges the financial support provided to him by the University of Engineering and Technology Lahore under the faculty development programme to conduct this research at Loughborough University . The use of Atomic Force Microscope at the Woflson School of Mechanical, Electrical and Manufacturing engineering, Loughborough University is also acknowledged. Publisher Copyright: © 2020 Elsevier Ltd

PY - 2020/11

Y1 - 2020/11

N2 - Atomic Force Microscope (AFM) is used to characterise the frictional response of surfaces with varying roughness parameters in dry and in the presence of fully formulated lubricants. The surface roughness has shown to affect nanoscale friction. The characteristics involved the investigation of roughness, small-scale adhesive forces and nanoscale friction using AFM in lateral force mode. The fluid-cell Lateral Force Microscopy (LFM) results were used to model thermal activation Eyring energy components in conjunction with the relevant continuum contact mechanics model. The paper shows that a combination of LFM, for dry and fluid-cell LFM and thermal activation Eyring energy barrier approach is a useful tool to explain the effect of surface roughness on nanoscale friction.

AB - Atomic Force Microscope (AFM) is used to characterise the frictional response of surfaces with varying roughness parameters in dry and in the presence of fully formulated lubricants. The surface roughness has shown to affect nanoscale friction. The characteristics involved the investigation of roughness, small-scale adhesive forces and nanoscale friction using AFM in lateral force mode. The fluid-cell Lateral Force Microscopy (LFM) results were used to model thermal activation Eyring energy components in conjunction with the relevant continuum contact mechanics model. The paper shows that a combination of LFM, for dry and fluid-cell LFM and thermal activation Eyring energy barrier approach is a useful tool to explain the effect of surface roughness on nanoscale friction.

KW - Eyring energy

KW - Fluid cell LFM

KW - Friction

KW - Roughness

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Thermal activation Eyring energy approach to characterise the dependence of nanoscale friction on the surface roughness

Abstract

Keywords

ASJC Scopus subject areas

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