The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits

A. Ahmad*, N. K. Nanda, K. Garg

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

11 Citations (Scopus)

Abstract

The impact of irreducible characteristic polynomials with respect to polynomial seeds on the effectiveness of an LFSR (linear feedback shift register)-based testing technique is studied through a simulation experiment. The results reveal that when irreducible characteristic polynomials are used in after data compression, the behavior of aliasing errors, with respect to polynomial seeds, is unchanged. The same conclusion is arrived at by the simulation study of many more circuits. This result has an important bearing on an LFSR-based testing of digital circuits.

Original languageEnglish
Pages494-496
Number of pages3
Publication statusPublished - 1989
Externally publishedYes
Event4th IEEE Region 10th International Conference - TENCON '89 - Bombay, India
Duration: Nov 22 1989Nov 24 1989

Other

Other4th IEEE Region 10th International Conference - TENCON '89
CityBombay, India
Period11/22/8911/24/89

ASJC Scopus subject areas

  • Engineering(all)

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