The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits

A. Ahmad; N. K. Nanda; K. Garg

The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits

A. Ahmad^*, N. K. Nanda, K. Garg

^*Corresponding author for this work

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

11 Citations (Scopus)

Abstract

The impact of irreducible characteristic polynomials with respect to polynomial seeds on the effectiveness of an LFSR (linear feedback shift register)-based testing technique is studied through a simulation experiment. The results reveal that when irreducible characteristic polynomials are used in after data compression, the behavior of aliasing errors, with respect to polynomial seeds, is unchanged. The same conclusion is arrived at by the simulation study of many more circuits. This result has an important bearing on an LFSR-based testing of digital circuits.

Original language	English
Title of host publication	TENCON '89: Fourth IEEE Region 10 International Conference
Publisher	Publ by IEEE
Pages	494-496
Number of pages	3
Publication status	Published - 1989
Event	4th IEEE Region 10th International Conference - TENCON '89 - Bombay, India Duration: Nov 22 1989 → Nov 24 1989

Other

Other	4th IEEE Region 10th International Conference - TENCON '89
City	Bombay, India
Period	11/22/89 → 11/24/89

ASJC Scopus subject areas

Engineering(all)

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title = "The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits",

abstract = "The impact of irreducible characteristic polynomials with respect to polynomial seeds on the effectiveness of an LFSR (linear feedback shift register)-based testing technique is studied through a simulation experiment. The results reveal that when irreducible characteristic polynomials are used in after data compression, the behavior of aliasing errors, with respect to polynomial seeds, is unchanged. The same conclusion is arrived at by the simulation study of many more circuits. This result has an important bearing on an LFSR-based testing of digital circuits.",

author = "A. Ahmad and Nanda, {N. K.} and K. Garg",

year = "1989",

language = "English",

pages = "494--496",

booktitle = "TENCON '89: Fourth IEEE Region 10 International Conference",

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note = "4th IEEE Region 10th International Conference - TENCON '89 ; Conference date: 22-11-1989 Through 24-11-1989",

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T1 - The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits

AU - Ahmad, A.

AU - Nanda, N. K.

AU - Garg, K.

PY - 1989

Y1 - 1989

N2 - The impact of irreducible characteristic polynomials with respect to polynomial seeds on the effectiveness of an LFSR (linear feedback shift register)-based testing technique is studied through a simulation experiment. The results reveal that when irreducible characteristic polynomials are used in after data compression, the behavior of aliasing errors, with respect to polynomial seeds, is unchanged. The same conclusion is arrived at by the simulation study of many more circuits. This result has an important bearing on an LFSR-based testing of digital circuits.

AB - The impact of irreducible characteristic polynomials with respect to polynomial seeds on the effectiveness of an LFSR (linear feedback shift register)-based testing technique is studied through a simulation experiment. The results reveal that when irreducible characteristic polynomials are used in after data compression, the behavior of aliasing errors, with respect to polynomial seeds, is unchanged. The same conclusion is arrived at by the simulation study of many more circuits. This result has an important bearing on an LFSR-based testing of digital circuits.

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M3 - Conference contribution

AN - SCOPUS:0024775352

SP - 494

EP - 496

BT - TENCON '89: Fourth IEEE Region 10 International Conference

PB - Publ by IEEE

T2 - 4th IEEE Region 10th International Conference - TENCON '89

Y2 - 22 November 1989 through 24 November 1989

ER -