Abstract
The impact of irreducible characteristic polynomials with respect to polynomial seeds on the effectiveness of an LFSR (linear feedback shift register)-based testing technique is studied through a simulation experiment. The results reveal that when irreducible characteristic polynomials are used in after data compression, the behavior of aliasing errors, with respect to polynomial seeds, is unchanged. The same conclusion is arrived at by the simulation study of many more circuits. This result has an important bearing on an LFSR-based testing of digital circuits.
| Original language | English |
|---|---|
| Title of host publication | TENCON '89: Fourth IEEE Region 10 International Conference |
| Publisher | Publ by IEEE |
| Pages | 494-496 |
| Number of pages | 3 |
| Publication status | Published - 1989 |
| Event | 4th IEEE Region 10th International Conference - TENCON '89 - Bombay, India Duration: Nov 22 1989 → Nov 24 1989 |
Other
| Other | 4th IEEE Region 10th International Conference - TENCON '89 |
|---|---|
| City | Bombay, India |
| Period | 11/22/89 → 11/24/89 |
ASJC Scopus subject areas
- Engineering(all)
Fingerprint Dive into the research topics of 'The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits'. Together they form a unique fingerprint.
Cite this
Ahmad, A., Nanda, N. K., & Garg, K. (1989). The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits. In TENCON '89: Fourth IEEE Region 10 International Conference (pp. 494-496). Publ by IEEE.