The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits

A. Ahmad, N. K. Nanda, K. Garg

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Abstract

The impact of irreducible characteristic polynomials with respect to polynomial seeds on the effectiveness of an LFSR (linear feedback shift register)-based testing technique is studied through a simulation experiment. The results reveal that when irreducible characteristic polynomials are used in after data compression, the behavior of aliasing errors, with respect to polynomial seeds, is unchanged. The same conclusion is arrived at by the simulation study of many more circuits. This result has an important bearing on an LFSR-based testing of digital circuits.

Original languageEnglish
Title of host publicationTENCON '89: Fourth IEEE Region 10 International Conference
PublisherPubl by IEEE
Pages494-496
Number of pages3
Publication statusPublished - 1989
Event4th IEEE Region 10th International Conference - TENCON '89 - Bombay, India
Duration: Nov 22 1989Nov 24 1989

Other

Other4th IEEE Region 10th International Conference - TENCON '89
CityBombay, India
Period11/22/8911/24/89

Fingerprint

Shift registers
Digital circuits
Polynomials
Feedback
Testing
Seed
Data compression
Networks (circuits)
Experiments

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Ahmad, A., Nanda, N. K., & Garg, K. (1989). The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits. In TENCON '89: Fourth IEEE Region 10 International Conference (pp. 494-496). Publ by IEEE.

The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits. / Ahmad, A.; Nanda, N. K.; Garg, K.

TENCON '89: Fourth IEEE Region 10 International Conference. Publ by IEEE, 1989. p. 494-496.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ahmad, A, Nanda, NK & Garg, K 1989, The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits. in TENCON '89: Fourth IEEE Region 10 International Conference. Publ by IEEE, pp. 494-496, 4th IEEE Region 10th International Conference - TENCON '89, Bombay, India, 11/22/89.
Ahmad A, Nanda NK, Garg K. The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits. In TENCON '89: Fourth IEEE Region 10 International Conference. Publ by IEEE. 1989. p. 494-496
Ahmad, A. ; Nanda, N. K. ; Garg, K. / The use of irreducible characteristic polynomials in an LFSR based testing of digital circuits. TENCON '89: Fourth IEEE Region 10 International Conference. Publ by IEEE, 1989. pp. 494-496
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