The effects of traffic patterns on power consumption of torus-connected NoCs with faults

F. Safaei, A. H. Shantia, A. Khonsari, M. Ould-Khaoua

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

High performance, reliability, transient and permanent fault-tolerance, and low energy consumption are major objectives of Networks-on-Chip (NoCs). Since, different applications impose various communication requirements in NoCs, a number of research studies have revealed that the performance advantages of routing schemes are more noticeable on power consumption under different traffic patterns. However, the power consumption issues of NoCs have not been thoroughly investigated in the presence of faulty regions. To the best of our knowledge, this research is the first attempt to examine the effects of most popular traffic patterns (i.e., Uniform, Local, and Hot-Spot) on power consumption of NoCs in the presence of permanent faults.

Original languageEnglish
Title of host publicationInternational Conference on Scalable Computing and Communications - The 8th International Conference on Embedded Computing, ScalCom-EmbeddedCom 2009
Pages627-632
Number of pages6
DOIs
Publication statusPublished - 2009
EventInternational Conference on Scalable Computing and Communications- 8th International Conference on Embedded Computing, ScalCom-EmbeddedCom 2009 - Dalian, China
Duration: Sep 25 2009Sep 27 2009

Other

OtherInternational Conference on Scalable Computing and Communications- 8th International Conference on Embedded Computing, ScalCom-EmbeddedCom 2009
CountryChina
CityDalian
Period9/25/099/27/09

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ASJC Scopus subject areas

  • Computational Theory and Mathematics
  • Computer Science Applications
  • Software

Cite this

Safaei, F., Shantia, A. H., Khonsari, A., & Ould-Khaoua, M. (2009). The effects of traffic patterns on power consumption of torus-connected NoCs with faults. In International Conference on Scalable Computing and Communications - The 8th International Conference on Embedded Computing, ScalCom-EmbeddedCom 2009 (pp. 627-632). [5341884] https://doi.org/10.1109/EmbeddedCom-ScalCom.2009.120