Testability, fault size and the domain-to-range ratio: An eternal triangle

Martin R. Woodward, Zuhoor A. Al-Khanjari

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

A number of different concepts have been proposed that, loosely speaking, revolve around the notion of software testability. Indeed, the concept of testability itself has been interpreted in a variety of ways by the software community. One interpretation is concerned with the extent of the modifications a program component requires, in terms of its input and output variables, so that the entire behaviour of the component is observable and controllable. Another interpretation is the ease with which faults, if present in a program, can be revealed by the testing process and the propagation, infection and execution (PIE) model has been proposed as a method of estimating this. It has been suggested that this particular interpretation of testability might be linked with the metric domain-to-range ratio (DRR), i.e. the ratio of the cardinality of the set of all inputs (the domain) to the cardinality of the set of all outputs (the range). This paper reports work in progress exploring some of the connections between the concepts mentioned. In particular, a simple mathematical link is established between domain-to-range ratio and the observability and controllability aspects of testability. In addition, the PIE model is re-considered and a relationship with fault size is observed. This leads to the suggestion that it might be more straightforward to estimate PIE testability by an adaptation of traditional mutation analysis. The latter suggestion exemplifies the main goals of the work described here, namely to seek greater understanding of testability in general and, ultimately, to find easier ways of determining it.

Original languageEnglish
Title of host publicationProceedings of the ACM SIGSOFT 2000 International Symposium on Software Testing and Analysis
EditorsM.J. Harrold, M.J. Harrold
Pages168-172
Number of pages5
Publication statusPublished - 2000
EventISSTA 00 Proceedings of the ACM SIGSOFT 2000 International Symposium on Software Testing and Analysis - Portland, OR, United States
Duration: Aug 21 2000Aug 24 2000

Other

OtherISSTA 00 Proceedings of the ACM SIGSOFT 2000 International Symposium on Software Testing and Analysis
CountryUnited States
CityPortland, OR
Period8/21/008/24/00

Fingerprint

Observability
Controllability
Testing

Keywords

  • Controllability
  • Domain-to-range ratio
  • Fault size
  • Observability
  • Testability

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Woodward, M. R., & Al-Khanjari, Z. A. (2000). Testability, fault size and the domain-to-range ratio: An eternal triangle. In M. J. Harrold, & M. J. Harrold (Eds.), Proceedings of the ACM SIGSOFT 2000 International Symposium on Software Testing and Analysis (pp. 168-172)

Testability, fault size and the domain-to-range ratio : An eternal triangle. / Woodward, Martin R.; Al-Khanjari, Zuhoor A.

Proceedings of the ACM SIGSOFT 2000 International Symposium on Software Testing and Analysis. ed. / M.J. Harrold; M.J. Harrold. 2000. p. 168-172.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Woodward, MR & Al-Khanjari, ZA 2000, Testability, fault size and the domain-to-range ratio: An eternal triangle. in MJ Harrold & MJ Harrold (eds), Proceedings of the ACM SIGSOFT 2000 International Symposium on Software Testing and Analysis. pp. 168-172, ISSTA 00 Proceedings of the ACM SIGSOFT 2000 International Symposium on Software Testing and Analysis, Portland, OR, United States, 8/21/00.
Woodward MR, Al-Khanjari ZA. Testability, fault size and the domain-to-range ratio: An eternal triangle. In Harrold MJ, Harrold MJ, editors, Proceedings of the ACM SIGSOFT 2000 International Symposium on Software Testing and Analysis. 2000. p. 168-172
Woodward, Martin R. ; Al-Khanjari, Zuhoor A. / Testability, fault size and the domain-to-range ratio : An eternal triangle. Proceedings of the ACM SIGSOFT 2000 International Symposium on Software Testing and Analysis. editor / M.J. Harrold ; M.J. Harrold. 2000. pp. 168-172
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