Synchrotron X-ray investigation of the layer spacing in a series of low molar mass bi-mesogen organosiloxane smectic materials

Carlo Carboni, David G. Carboni, Dražan Jozić, Sigrid Bernstorff, Michael Rappolt, Samia Al-Mahrazi

Research output: Contribution to journalArticle

Abstract

The temperature dependence of the layer spacing of a series of chiral bi-mesogen organosiloxane liquid-crystal materials is presented. The detailed measurements were taken at the ELETTRA radiation source in Trieste on thin specimens contained between glass coverslips. In the materials with 10 and 11 spacers between the siloxane and the mesogenic moiety, it is observed that the temperature dependence of the layer spacing is not monotonous. In the material with six spacers, there is an abrupt change of 0.01 nm in the layer spacing between 35 °C and 36 °C. In this temperature range, domains with both layer spacing coexist. This observation is in agreement with polarised light microscopy observations; however, detailed differential scanning calorimetry (DSC) measurements show no heat associated with this transition.

Original languageEnglish
Pages (from-to)739-745
Number of pages7
JournalPhase Transitions
Volume87
Issue number8
DOIs
Publication statusPublished - Aug 3 2014

Keywords

  • bi-mesogen, synchrotron X-ray
  • ferroelectric
  • layer spacing
  • organosiloxane
  • smectic liquid crystal

ASJC Scopus subject areas

  • Instrumentation
  • Materials Science(all)

Fingerprint Dive into the research topics of 'Synchrotron X-ray investigation of the layer spacing in a series of low molar mass bi-mesogen organosiloxane smectic materials'. Together they form a unique fingerprint.

  • Cite this