Abstract
Excitation of surface plasmons by attenuated total reflection is used to optically characterize platinum silicide films and to produce enhanced photosignals from PtSi-Si Schottky barrier devices. In this work the Otto configuration (prism-air gap-sample) for attenuated total reflection is used to excite the mode at the air-PtSi interface on PtSi-Si structures; surface plasmon excitation is evidenced as a prominent dip in measurement of reflectance as a function of internal angle of incidence in the prism. Coupling efficiencies of 90 - 95% between incoming p-polarized radiation and surface plasmons on PtSi have been achieved at wavelengths ranging from the visible to the infrared (0.633 μm to 3.39 μm). The surface plasmon energy is dissipated by absorption through the creation of electron-hole pairs in the lossy silicide layer. Subsequent hot carrier emission over the Schottky barrier can thus yield an enhanced photosignal associated with the enhanced absorption due to surface plasmon excitation - initial results demonstrating this phenomenon are reported. here. Finally, reflectivity calculations show also the possibility of infrared surface plasmon excitation in PtSi grating structures with periodicity of the same order as the wavelength.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Editors | Wagih H. Makky |
| Publisher | Publ by Society of Photo-Optical Instrumentation Engineers |
| Pages | 240-249 |
| Number of pages | 10 |
| Volume | 1735 |
| ISBN (Print) | 0819409081 |
| Publication status | Published - 1992 |
| Event | Infrared Detectors: State of the Art - San Diego, CA, USA Duration: Jul 19 1992 → Jul 19 1992 |
Other
| Other | Infrared Detectors: State of the Art |
|---|---|
| City | San Diego, CA, USA |
| Period | 7/19/92 → 7/19/92 |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
Cite this
Surface plasmons on PtSi for visible and infrared Schottky-barrier-enhanced detection. / Sellai, Azzouz; McCafferty, P. G.; Dawson, Paul; Raza, S. H.; Gamble, Harold S.
Proceedings of SPIE - The International Society for Optical Engineering. ed. / Wagih H. Makky. Vol. 1735 Publ by Society of Photo-Optical Instrumentation Engineers, 1992. p. 240-249.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Surface plasmons on PtSi for visible and infrared Schottky-barrier-enhanced detection
AU - Sellai, Azzouz
AU - McCafferty, P. G.
AU - Dawson, Paul
AU - Raza, S. H.
AU - Gamble, Harold S.
PY - 1992
Y1 - 1992
N2 - Excitation of surface plasmons by attenuated total reflection is used to optically characterize platinum silicide films and to produce enhanced photosignals from PtSi-Si Schottky barrier devices. In this work the Otto configuration (prism-air gap-sample) for attenuated total reflection is used to excite the mode at the air-PtSi interface on PtSi-Si structures; surface plasmon excitation is evidenced as a prominent dip in measurement of reflectance as a function of internal angle of incidence in the prism. Coupling efficiencies of 90 - 95% between incoming p-polarized radiation and surface plasmons on PtSi have been achieved at wavelengths ranging from the visible to the infrared (0.633 μm to 3.39 μm). The surface plasmon energy is dissipated by absorption through the creation of electron-hole pairs in the lossy silicide layer. Subsequent hot carrier emission over the Schottky barrier can thus yield an enhanced photosignal associated with the enhanced absorption due to surface plasmon excitation - initial results demonstrating this phenomenon are reported. here. Finally, reflectivity calculations show also the possibility of infrared surface plasmon excitation in PtSi grating structures with periodicity of the same order as the wavelength.
AB - Excitation of surface plasmons by attenuated total reflection is used to optically characterize platinum silicide films and to produce enhanced photosignals from PtSi-Si Schottky barrier devices. In this work the Otto configuration (prism-air gap-sample) for attenuated total reflection is used to excite the mode at the air-PtSi interface on PtSi-Si structures; surface plasmon excitation is evidenced as a prominent dip in measurement of reflectance as a function of internal angle of incidence in the prism. Coupling efficiencies of 90 - 95% between incoming p-polarized radiation and surface plasmons on PtSi have been achieved at wavelengths ranging from the visible to the infrared (0.633 μm to 3.39 μm). The surface plasmon energy is dissipated by absorption through the creation of electron-hole pairs in the lossy silicide layer. Subsequent hot carrier emission over the Schottky barrier can thus yield an enhanced photosignal associated with the enhanced absorption due to surface plasmon excitation - initial results demonstrating this phenomenon are reported. here. Finally, reflectivity calculations show also the possibility of infrared surface plasmon excitation in PtSi grating structures with periodicity of the same order as the wavelength.
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M3 - Conference contribution
SN - 0819409081
VL - 1735
SP - 240
EP - 249
BT - Proceedings of SPIE - The International Society for Optical Engineering
A2 - Makky, Wagih H.
PB - Publ by Society of Photo-Optical Instrumentation Engineers
ER -