Abstract
Spatially resolved photoluminescence (PL) measurements are used to study the effect of etching (HF, HNO3, NH4OH, H 2O2) and annealing of InP surface. We reveal a strong nonuniformity of the PL intensity on a microscopic scale and a large dependence of the morphology of the PL images on chemical treatment and annealing of InP samples.
Original language | English |
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Pages (from-to) | 392-395 |
Number of pages | 4 |
Journal | Journal of Applied Physics |
Volume | 60 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1986 |
Externally published | Yes |
ASJC Scopus subject areas
- General Physics and Astronomy