Abstract
Photoluminescence spectra were measured on variously processed InP surfaces and InP-Insulator interfaces and correlated with the results of electrical characterization of MIS structures.
Original language | English |
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Pages (from-to) | 753-754 |
Number of pages | 2 |
Journal | Journal of Luminescence |
Volume | 40-41 |
Issue number | C |
DOIs | |
Publication status | Published - 1988 |
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ASJC Scopus subject areas
- Physical and Theoretical Chemistry
- Atomic and Molecular Physics, and Optics
Cite this
Studies of InP surface and InP-insulator interface by spectral photoluminescence. / Leyral, P.; Bouredoucen, H.; Commere, B.; Krawczyk, S.
In: Journal of Luminescence, Vol. 40-41, No. C, 1988, p. 753-754.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Studies of InP surface and InP-insulator interface by spectral photoluminescence
AU - Leyral, P.
AU - Bouredoucen, H.
AU - Commere, B.
AU - Krawczyk, S.
PY - 1988
Y1 - 1988
N2 - Photoluminescence spectra were measured on variously processed InP surfaces and InP-Insulator interfaces and correlated with the results of electrical characterization of MIS structures.
AB - Photoluminescence spectra were measured on variously processed InP surfaces and InP-Insulator interfaces and correlated with the results of electrical characterization of MIS structures.
UR - http://www.scopus.com/inward/record.url?scp=0023290266&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0023290266&partnerID=8YFLogxK
U2 - 10.1016/0022-2313(88)90422-X
DO - 10.1016/0022-2313(88)90422-X
M3 - Article
AN - SCOPUS:0023290266
VL - 40-41
SP - 753
EP - 754
JO - Journal of Luminescence
JF - Journal of Luminescence
SN - 0022-2313
IS - C
ER -