Studies of InP surface and InP-insulator interface by spectral photoluminescence

P. Leyral; H. Bouredoucen; B. Commere; S. Krawczyk

doi:10.1016/0022-2313(88)90422-X

Studies of InP surface and InP-insulator interface by spectral photoluminescence

P. Leyral^*, H. Bouredoucen, B. Commere, S. Krawczyk

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

Photoluminescence spectra were measured on variously processed InP surfaces and InP-Insulator interfaces and correlated with the results of electrical characterization of MIS structures.

Original language	English
Pages (from-to)	753-754
Number of pages	2
Journal	Journal of Luminescence
Volume	40-41
Issue number	C
DOIs	https://doi.org/10.1016/0022-2313(88)90422-X
Publication status	Published - Feb 1988
Externally published	Yes

ASJC Scopus subject areas

Biophysics
Biochemistry
Chemistry(all)
Atomic and Molecular Physics, and Optics
Condensed Matter Physics

Access to Document

10.1016/0022-2313(88)90422-X

Cite this

@article{d7e4e9bd59b645ccbe03d8e95ba08ed1,

title = "Studies of InP surface and InP-insulator interface by spectral photoluminescence",

abstract = "Photoluminescence spectra were measured on variously processed InP surfaces and InP-Insulator interfaces and correlated with the results of electrical characterization of MIS structures.",

author = "P. Leyral and H. Bouredoucen and B. Commere and S. Krawczyk",

year = "1988",

month = feb,

doi = "10.1016/0022-2313(88)90422-X",

language = "English",

volume = "40-41",

pages = "753--754",

journal = "Journal of Luminescence",

issn = "0022-2313",

publisher = "Elsevier",

number = "C",

}

TY - JOUR

T1 - Studies of InP surface and InP-insulator interface by spectral photoluminescence

AU - Leyral, P.

AU - Bouredoucen, H.

AU - Commere, B.

AU - Krawczyk, S.

PY - 1988/2

Y1 - 1988/2

N2 - Photoluminescence spectra were measured on variously processed InP surfaces and InP-Insulator interfaces and correlated with the results of electrical characterization of MIS structures.

AB - Photoluminescence spectra were measured on variously processed InP surfaces and InP-Insulator interfaces and correlated with the results of electrical characterization of MIS structures.

UR - http://www.scopus.com/inward/record.url?scp=0023290266&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0023290266&partnerID=8YFLogxK

U2 - 10.1016/0022-2313(88)90422-X

DO - 10.1016/0022-2313(88)90422-X

M3 - Article

AN - SCOPUS:0023290266

SN - 0022-2313

VL - 40-41

SP - 753

EP - 754

JO - Journal of Luminescence

JF - Journal of Luminescence

IS - C

ER -

Studies of InP surface and InP-insulator interface by spectral photoluminescence

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this