Studies of InP surface and InP-insulator interface by spectral photoluminescence

P. Leyral, H. Bouredoucen, B. Commere, S. Krawczyk

Research output: Contribution to journalArticle

Abstract

Photoluminescence spectra were measured on variously processed InP surfaces and InP-Insulator interfaces and correlated with the results of electrical characterization of MIS structures.

Original languageEnglish
Pages (from-to)753-754
Number of pages2
JournalJournal of Luminescence
Volume40-41
Issue numberC
DOIs
Publication statusPublished - 1988

Fingerprint

Management information systems
MIS (semiconductors)
Photoluminescence
insulators
photoluminescence

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Atomic and Molecular Physics, and Optics

Cite this

Studies of InP surface and InP-insulator interface by spectral photoluminescence. / Leyral, P.; Bouredoucen, H.; Commere, B.; Krawczyk, S.

In: Journal of Luminescence, Vol. 40-41, No. C, 1988, p. 753-754.

Research output: Contribution to journalArticle

Leyral, P. ; Bouredoucen, H. ; Commere, B. ; Krawczyk, S. / Studies of InP surface and InP-insulator interface by spectral photoluminescence. In: Journal of Luminescence. 1988 ; Vol. 40-41, No. C. pp. 753-754.
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