Abstract
Photoluminescence spectra were measured on variously processed InP surfaces and InP-Insulator interfaces and correlated with the results of electrical characterization of MIS structures.
| Original language | English |
|---|---|
| Pages (from-to) | 753-754 |
| Number of pages | 2 |
| Journal | Journal of Luminescence |
| Volume | 40-41 |
| Issue number | C |
| DOIs | |
| Publication status | Published - 1988 |
ASJC Scopus subject areas
- Physical and Theoretical Chemistry
- Atomic and Molecular Physics, and Optics
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Leyral, P., Bouredoucen, H., Commere, B., & Krawczyk, S. (1988). Studies of InP surface and InP-insulator interface by spectral photoluminescence. Journal of Luminescence, 40-41(C), 753-754. https://doi.org/10.1016/0022-2313(88)90422-X