Response Data Compression Techniques in Digital Circuit Testing - Study and Evaluation

Al Balushi Jaber, Afaq Ahmad

Research output: Book/ReportBook

Original languageEnglish
Number of pages96
Publication statusPublished - Nov 11 2014

Cite this

Response Data Compression Techniques in Digital Circuit Testing - Study and Evaluation. / Jaber, Al Balushi; Ahmad, Afaq.

2014. 96 p.

Research output: Book/ReportBook

@book{01b23c6fed114c85bf8122048f674def,
title = "Response Data Compression Techniques in Digital Circuit Testing - Study and Evaluation",
author = "Jaber, {Al Balushi} and Afaq Ahmad",
year = "2014",
month = "11",
day = "11",
language = "English",
isbn = "978-3-659-23961-8",

}

TY - BOOK

T1 - Response Data Compression Techniques in Digital Circuit Testing - Study and Evaluation

AU - Jaber, Al Balushi

AU - Ahmad, Afaq

PY - 2014/11/11

Y1 - 2014/11/11

M3 - Book

SN - 978-3-659-23961-8

BT - Response Data Compression Techniques in Digital Circuit Testing - Study and Evaluation

ER -