Reliability of Pt ohmic contact on an undoped 3C-SiC micro-electrothermal device

Musaab Hassan*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Fingerprint

Dive into the research topics of 'Reliability of Pt ohmic contact on an undoped 3C-SiC micro-electrothermal device'. Together they form a unique fingerprint.

Physics

Engineering

Material Science