Abstract
Comprehensive study on the source of electromagnetic radiation from apertures placed in conducting screens and enclosure is presented. Novel technique comprising placement of electromagnetic bandgap (EBG) structures immediately around the apertures openings is presented to suppress the surface currents and consequently to reduce the radiation from the apertures. The effectiveness of the proposed technique is demonstrated through several detailed parametric studies and numerical full-wave simulations quantifying the strength of electromagnetic fields in near and far regions from the aperture. In fact, using the EBG structures, more than 20-dB reduction is achieved in the near- and far-field radiation without affecting the aperture size. Finally, a detailed experimental case study from real-world environment is presented to validate the proposed concept.
Original language | English |
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Article number | 6731525 |
Pages (from-to) | 929-937 |
Number of pages | 9 |
Journal | IEEE Transactions on Components, Packaging and Manufacturing Technology |
Volume | 4 |
Issue number | 5 |
DOIs | |
Publication status | Published - May 2014 |
Keywords
- Apertures
- Electromagnetic bandgap (EBG) structures
- Electromagnetic interference
- Field leakage
- Shielding
- Surface current
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Industrial and Manufacturing Engineering
- Electrical and Electronic Engineering