Quantifying charge carrier concentration in ZnO thin films by Scanning Kelvin Probe Microscopy

C. Maragliano*, S. Lilliu, M. S. Dahlem, M. Chiesa, T. Souier, M. Stefancich

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

93 Citations (Scopus)

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Physics

Material Science