Measurement of in-plane motions and rotations using a simple electronic speckle pattern interferometer

K. M. Abedin, M. Wahadoszamen, A. F M Y Haider

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

We describe the construction and operation of a simple electronic speckle pattern interferometer which is sensitive to in-plane motions and rotations. The interferometer is extremely simple and easy to use. It uses a commercial digital still camera for image acquisition, and a personal computer for image storage and analysis. The interferometer was used to measure very small in-plane rotations of a rough surface, and the results were found to be in good agreement with the expected values. We propose to use this system as an instrument for the measurement of small-angle rotations.

Original languageEnglish
Pages (from-to)293-298
Number of pages6
JournalOptics and Laser Technology
Volume34
Issue number4
DOIs
Publication statusPublished - Jun 2002

Keywords

  • Digital still camera
  • Electronic speckle pattern interferometer
  • Measurement of small rotations

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

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