Measurement of dielectric constant using a microwave microstrip ring resonator (MMRR) at 10 GHz irrespective of the type of overlay

S. R G Sofin, R. C. Aiyer

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

A new equation to measure the dielectric constant of materials using a microwave microstrip ring resonator (MMRR) at 10 GHz by empirically modifying the design equation of the effective dielectric constant of the system is proposed. Each material, with the proper size of interest, is overlaid on the MMRR and the change in resonance frequency caused by the change of effective dielectric constant of the system is measured, which depends on the dielectric constant, thickness, and type of overlay (complete or partial). No equations are available for obtaining the dielectric constant of the materials, which are used as partial overlays. The proposed equation can be used for both a complete and a crossed partial overlay. Validation of the equation is done using different dielectric materials and is in good agreement with the experimental results (within±1%). This will be useful in applications such as grain-moisture sensing using/MMRR.

Original languageEnglish
Pages (from-to)11-14
Number of pages4
JournalMicrowave and Optical Technology Letters
Volume47
Issue number1
DOIs
Publication statusPublished - Oct 5 2005

Fingerprint

Resonators
Permittivity
resonators
Microwaves
permittivity
microwaves
rings
moisture
Moisture

Keywords

  • Dielectric constant
  • Microwave microstrip ring resonator (MMRR)
  • Partial overlay

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

Cite this

@article{5e22b509dc7d4aa5a48275a9e1ec3c32,
title = "Measurement of dielectric constant using a microwave microstrip ring resonator (MMRR) at 10 GHz irrespective of the type of overlay",
abstract = "A new equation to measure the dielectric constant of materials using a microwave microstrip ring resonator (MMRR) at 10 GHz by empirically modifying the design equation of the effective dielectric constant of the system is proposed. Each material, with the proper size of interest, is overlaid on the MMRR and the change in resonance frequency caused by the change of effective dielectric constant of the system is measured, which depends on the dielectric constant, thickness, and type of overlay (complete or partial). No equations are available for obtaining the dielectric constant of the materials, which are used as partial overlays. The proposed equation can be used for both a complete and a crossed partial overlay. Validation of the equation is done using different dielectric materials and is in good agreement with the experimental results (within±1{\%}). This will be useful in applications such as grain-moisture sensing using/MMRR.",
keywords = "Dielectric constant, Microwave microstrip ring resonator (MMRR), Partial overlay",
author = "Sofin, {S. R G} and Aiyer, {R. C.}",
year = "2005",
month = "10",
day = "5",
doi = "10.1002/mop.21066",
language = "English",
volume = "47",
pages = "11--14",
journal = "Microwave and Optical Technology Letters",
issn = "0895-2477",
publisher = "John Wiley and Sons Inc.",
number = "1",

}

TY - JOUR

T1 - Measurement of dielectric constant using a microwave microstrip ring resonator (MMRR) at 10 GHz irrespective of the type of overlay

AU - Sofin, S. R G

AU - Aiyer, R. C.

PY - 2005/10/5

Y1 - 2005/10/5

N2 - A new equation to measure the dielectric constant of materials using a microwave microstrip ring resonator (MMRR) at 10 GHz by empirically modifying the design equation of the effective dielectric constant of the system is proposed. Each material, with the proper size of interest, is overlaid on the MMRR and the change in resonance frequency caused by the change of effective dielectric constant of the system is measured, which depends on the dielectric constant, thickness, and type of overlay (complete or partial). No equations are available for obtaining the dielectric constant of the materials, which are used as partial overlays. The proposed equation can be used for both a complete and a crossed partial overlay. Validation of the equation is done using different dielectric materials and is in good agreement with the experimental results (within±1%). This will be useful in applications such as grain-moisture sensing using/MMRR.

AB - A new equation to measure the dielectric constant of materials using a microwave microstrip ring resonator (MMRR) at 10 GHz by empirically modifying the design equation of the effective dielectric constant of the system is proposed. Each material, with the proper size of interest, is overlaid on the MMRR and the change in resonance frequency caused by the change of effective dielectric constant of the system is measured, which depends on the dielectric constant, thickness, and type of overlay (complete or partial). No equations are available for obtaining the dielectric constant of the materials, which are used as partial overlays. The proposed equation can be used for both a complete and a crossed partial overlay. Validation of the equation is done using different dielectric materials and is in good agreement with the experimental results (within±1%). This will be useful in applications such as grain-moisture sensing using/MMRR.

KW - Dielectric constant

KW - Microwave microstrip ring resonator (MMRR)

KW - Partial overlay

UR - http://www.scopus.com/inward/record.url?scp=27644515314&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=27644515314&partnerID=8YFLogxK

U2 - 10.1002/mop.21066

DO - 10.1002/mop.21066

M3 - Article

VL - 47

SP - 11

EP - 14

JO - Microwave and Optical Technology Letters

JF - Microwave and Optical Technology Letters

SN - 0895-2477

IS - 1

ER -