Magnetization reorientation in antiferromagnetically coupled Co films and (Co/Pd) multilayers

Rachid Sbiaa*, S. N. Piramanayagam, Randall Law

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

20 Citations (Scopus)


Magnetization reversal of antiferromagnetically coupled (AFC) Co thin film and (Co/Pd) multilayers has been investigated. For 5 Å thick Co layer, a high exchange coupling field (H ex) of 7.8 kOe at room temperature and 8.5 kOe at 5 K was measured from the shift in the hysteresis loop. This high value of Hex was accompanied by a magnetization reorientation from in-plane to out-of-plane of the thin Co. When Co thickness increases, the magnetization reorientation was not possible. This unusual high Hex can be used to stabilize AFC structures when the patterning to nanoscale size is needed.

Original languageEnglish
Article number242502
JournalApplied Physics Letters
Issue number24
Publication statusPublished - Dec 14 2009
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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