Abstract
A current sensing atomic force microscope was used to study the topography and the local electronic properties of the passive film formed on a duplex ferrite-austenite stainless steel (Uranus 50). Comparison of current maps with topography AFM images reveals that the passive film covering austenite and ferrite phases exhibits different properties. On freshly formed passive film, a high and homogenous resistance (typically 10 GΩ for 1 V) characterises the film on austenite grains while current maps of the passive layer covering the ferrite grains show a high density of spots (few 100 MΩ for 1 V). Besides the current maps, local I-V curves acquired on austenite show wider band gap energy than the ones obtained on ferrite grains. Finally, the conductivity difference in passive films covering ferrite and austenite grains is discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 2434-2439 |
| Number of pages | 6 |
| Journal | Applied Surface Science |
| Volume | 256 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - Feb 1 2010 |
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Keywords
- Conducting atomic force microscopy
- Passive film
- Semiconductor
- Stainless steel
ASJC Scopus subject areas
- Surfaces, Coatings and Films
Cite this
Local electrical characteristics of passive films formed on stainless steel surfaces by current sensing atomic force microscopy. / Souier, T.; Martin, F.; Bataillon, C.; Cousty, J.
In: Applied Surface Science, Vol. 256, No. 8, 01.02.2010, p. 2434-2439.Research output: Contribution to journal › Article
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TY - JOUR
T1 - Local electrical characteristics of passive films formed on stainless steel surfaces by current sensing atomic force microscopy
AU - Souier, T.
AU - Martin, F.
AU - Bataillon, C.
AU - Cousty, J.
PY - 2010/2/1
Y1 - 2010/2/1
N2 - A current sensing atomic force microscope was used to study the topography and the local electronic properties of the passive film formed on a duplex ferrite-austenite stainless steel (Uranus 50). Comparison of current maps with topography AFM images reveals that the passive film covering austenite and ferrite phases exhibits different properties. On freshly formed passive film, a high and homogenous resistance (typically 10 GΩ for 1 V) characterises the film on austenite grains while current maps of the passive layer covering the ferrite grains show a high density of spots (few 100 MΩ for 1 V). Besides the current maps, local I-V curves acquired on austenite show wider band gap energy than the ones obtained on ferrite grains. Finally, the conductivity difference in passive films covering ferrite and austenite grains is discussed.
AB - A current sensing atomic force microscope was used to study the topography and the local electronic properties of the passive film formed on a duplex ferrite-austenite stainless steel (Uranus 50). Comparison of current maps with topography AFM images reveals that the passive film covering austenite and ferrite phases exhibits different properties. On freshly formed passive film, a high and homogenous resistance (typically 10 GΩ for 1 V) characterises the film on austenite grains while current maps of the passive layer covering the ferrite grains show a high density of spots (few 100 MΩ for 1 V). Besides the current maps, local I-V curves acquired on austenite show wider band gap energy than the ones obtained on ferrite grains. Finally, the conductivity difference in passive films covering ferrite and austenite grains is discussed.
KW - Conducting atomic force microscopy
KW - Passive film
KW - Semiconductor
KW - Stainless steel
UR - http://www.scopus.com/inward/record.url?scp=74149088707&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=74149088707&partnerID=8YFLogxK
U2 - 10.1016/j.apsusc.2009.10.083
DO - 10.1016/j.apsusc.2009.10.083
M3 - Article
AN - SCOPUS:74149088707
VL - 256
SP - 2434
EP - 2439
JO - Applied Surface Science
JF - Applied Surface Science
SN - 0169-4332
IS - 8
ER -