Investigation of a constant behavior of aliasing errors in signature analysis due to the use of different ordered test-patterns in LFSR based testing techniques

Afaq Ahmad*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

In this paper, the impact of the change of the order of the test patterns, on error masking behavior of signature analysis scheme used in an linear feedback shift register (LFSR) based testing technique, is investigated. The investigation is carried-out through an extensive simulation study of the effectiveness of an LFSR based testing technique. The results of the simulation study show that the probability of aliasing errors remains unchanged although the changed order of the input test-sequences were applied to the circuit under test.

Original languageEnglish
Pages (from-to)967-974
Number of pages8
JournalMicroelectronics Reliability
Volume42
Issue number6
DOIs
Publication statusPublished - Jun 2002

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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