Abstract
In this paper, the impact of the change of the order of the test patterns, on error masking behavior of signature analysis scheme used in an linear feedback shift register (LFSR) based testing technique, is investigated. The investigation is carried-out through an extensive simulation study of the effectiveness of an LFSR based testing technique. The results of the simulation study show that the probability of aliasing errors remains unchanged although the changed order of the input test-sequences were applied to the circuit under test.
| Original language | English |
|---|---|
| Pages (from-to) | 967-974 |
| Number of pages | 8 |
| Journal | Microelectronics Reliability |
| Volume | 42 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - Jun 2002 |
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ASJC Scopus subject areas
- Control and Systems Engineering
- Electrical and Electronic Engineering
Cite this
Investigation of a constant behavior of aliasing errors in signature analysis due to the use of different ordered test-patterns in LFSR based testing techniques. / Ahmad, Afaq.
In: Microelectronics Reliability, Vol. 42, No. 6, 06.2002, p. 967-974.Research output: Contribution to journal › Article
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TY - JOUR
T1 - Investigation of a constant behavior of aliasing errors in signature analysis due to the use of different ordered test-patterns in LFSR based testing techniques
AU - Ahmad, Afaq
PY - 2002/6
Y1 - 2002/6
N2 - In this paper, the impact of the change of the order of the test patterns, on error masking behavior of signature analysis scheme used in an linear feedback shift register (LFSR) based testing technique, is investigated. The investigation is carried-out through an extensive simulation study of the effectiveness of an LFSR based testing technique. The results of the simulation study show that the probability of aliasing errors remains unchanged although the changed order of the input test-sequences were applied to the circuit under test.
AB - In this paper, the impact of the change of the order of the test patterns, on error masking behavior of signature analysis scheme used in an linear feedback shift register (LFSR) based testing technique, is investigated. The investigation is carried-out through an extensive simulation study of the effectiveness of an LFSR based testing technique. The results of the simulation study show that the probability of aliasing errors remains unchanged although the changed order of the input test-sequences were applied to the circuit under test.
UR - http://www.scopus.com/inward/record.url?scp=0036603906&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0036603906&partnerID=8YFLogxK
U2 - 10.1016/S0026-2714(02)00018-5
DO - 10.1016/S0026-2714(02)00018-5
M3 - Article
AN - SCOPUS:0036603906
VL - 42
SP - 967
EP - 974
JO - Microelectronics and Reliability
JF - Microelectronics and Reliability
SN - 0026-2714
IS - 6
ER -