Abstract
Scatter plate interferometers provide a precise method to test the quality of concave mirrors. In this article we describe a method to integrate a scatter plate and a projection lens into a single binary micro-optical element, which is a crucial part of the scatter plate interferometer. We have designed an integrated element with the aid of a computer and fabricated it using the e-beam lithography method. We present experimental verification and some computer simulation results.
Original language | English |
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Pages (from-to) | 1587-1590 |
Number of pages | 4 |
Journal | Review of Scientific Instruments |
Volume | 69 |
Issue number | 4 |
DOIs | |
Publication status | Published - Apr 1998 |
Externally published | Yes |
ASJC Scopus subject areas
- Instrumentation