Identification and quantification of the dissipative mechanisms involved in the radial permanent deformation of carbon nanotubes

Tewfik Souier, Sergio Santos, Karim Gadelrab, Amal Al Ghaferi, Matteo Chiesa

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Recent advances in atomic force microscopy (AFM) are used here to determine, decouple and quantify the dissipative processes involved in the interaction between a silicon tip and a carbon nanotube (CNT). The energy dissipated per atom due to hysteretic contact processes on the CNT remains constant with increasing cantilever stored energy. The energy dissipated due to viscoelasticity, however, increases in the order of several eVnm 2 per nm of free amplitude until the CNT eventually laterally deforms. This trend is general in amplitude modulation AFM and could be used to determine the nature and effects of dissipation for other relevant nanostructures.

Original languageEnglish
Article number335402
JournalJournal of Physics D: Applied Physics
Volume45
Issue number33
DOIs
Publication statusPublished - Aug 22 2012

Fingerprint

Carbon Nanotubes
Carbon nanotubes
carbon nanotubes
Atomic force microscopy
atomic force microscopy
Amplitude modulation
viscoelasticity
Viscoelasticity
Silicon
energy
Nanostructures
dissipation
trends
Atoms
silicon
atoms
interactions

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Acoustics and Ultrasonics
  • Surfaces, Coatings and Films

Cite this

Identification and quantification of the dissipative mechanisms involved in the radial permanent deformation of carbon nanotubes. / Souier, Tewfik; Santos, Sergio; Gadelrab, Karim; Al Ghaferi, Amal; Chiesa, Matteo.

In: Journal of Physics D: Applied Physics, Vol. 45, No. 33, 335402, 22.08.2012.

Research output: Contribution to journalArticle

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