How to design an effective Serial Input Shift Register (SISR) for data compression process of built-in self-test methodology

A. Ahmad; Al Balushi Jaber

doi:10.1109/IDT.2009.5404091

How to design an effective Serial Input Shift Register (SISR) for data compression process of built-in self-test methodology

A. Ahmad^*, Al Balushi Jaber

^*Corresponding author for this work

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

This paper investigates the impact of characteristic polynomial on an effective design of Serial Input Shift Register (SISR). How the use of a primitive characteristic polynomial cannot cope with the minimization of aliasing error probability. Further, the paper also, suggests about the selection of characteristic polynomial to minimize hardware, power dissipation and test data compression time. The study of this paper is based on simulation study using a suitably developed tool.

Original language	English
Title of host publication	2009 4th International Design and Test Workshop, IDT 2009
DOIs	https://doi.org/10.1109/IDT.2009.5404091
Publication status	Published - 2009
Event	2009 4th International Design and Test Workshop, IDT 2009 - Riyadh, Saudi Arabia Duration: Nov 15 2009 → Nov 17 2009

Publication series

Name	2009 4th International Design and Test Workshop, IDT 2009

Other

Other	2009 4th International Design and Test Workshop, IDT 2009
Country/Territory	Saudi Arabia
City	Riyadh
Period	11/15/09 → 11/17/09

Keywords

Aliasing error
Built-in self-test
Characteristic polynomial
Circuit under test
Design for testability
Linear feedback shift registers
Primitive polynomial
Serial input shift register
System on chip

ASJC Scopus subject areas

Computer Science(all)
Control and Systems Engineering

Access to Document

10.1109/IDT.2009.5404091

Cite this

How to design an effective Serial Input Shift Register (SISR) for data compression process of built-in self-test methodology. / Ahmad, A.; Jaber, Al Balushi.

2009 4th International Design and Test Workshop, IDT 2009. 2009. 5404091 (2009 4th International Design and Test Workshop, IDT 2009).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ahmad, A & Jaber, AB 2009, How to design an effective Serial Input Shift Register (SISR) for data compression process of built-in self-test methodology. in 2009 4th International Design and Test Workshop, IDT 2009., 5404091, 2009 4th International Design and Test Workshop, IDT 2009, 2009 4th International Design and Test Workshop, IDT 2009, Riyadh, Saudi Arabia, 11/15/09. https://doi.org/10.1109/IDT.2009.5404091

@inproceedings{99a53eaab1c64370bd80385a43bdb231,

title = "How to design an effective Serial Input Shift Register (SISR) for data compression process of built-in self-test methodology",

abstract = "This paper investigates the impact of characteristic polynomial on an effective design of Serial Input Shift Register (SISR). How the use of a primitive characteristic polynomial cannot cope with the minimization of aliasing error probability. Further, the paper also, suggests about the selection of characteristic polynomial to minimize hardware, power dissipation and test data compression time. The study of this paper is based on simulation study using a suitably developed tool.",

keywords = "Aliasing error, Built-in self-test, Characteristic polynomial, Circuit under test, Design for testability, Linear feedback shift registers, Primitive polynomial, Serial input shift register, System on chip",

author = "A. Ahmad and Jaber, {Al Balushi}",

year = "2009",

doi = "10.1109/IDT.2009.5404091",

language = "English",

isbn = "9781424457489",

series = "2009 4th International Design and Test Workshop, IDT 2009",

booktitle = "2009 4th International Design and Test Workshop, IDT 2009",

note = "2009 4th International Design and Test Workshop, IDT 2009 ; Conference date: 15-11-2009 Through 17-11-2009",

}

TY - GEN

T1 - How to design an effective Serial Input Shift Register (SISR) for data compression process of built-in self-test methodology

AU - Ahmad, A.

AU - Jaber, Al Balushi

PY - 2009

Y1 - 2009

N2 - This paper investigates the impact of characteristic polynomial on an effective design of Serial Input Shift Register (SISR). How the use of a primitive characteristic polynomial cannot cope with the minimization of aliasing error probability. Further, the paper also, suggests about the selection of characteristic polynomial to minimize hardware, power dissipation and test data compression time. The study of this paper is based on simulation study using a suitably developed tool.

AB - This paper investigates the impact of characteristic polynomial on an effective design of Serial Input Shift Register (SISR). How the use of a primitive characteristic polynomial cannot cope with the minimization of aliasing error probability. Further, the paper also, suggests about the selection of characteristic polynomial to minimize hardware, power dissipation and test data compression time. The study of this paper is based on simulation study using a suitably developed tool.

KW - Aliasing error

KW - Built-in self-test

KW - Characteristic polynomial

KW - Circuit under test

KW - Design for testability

KW - Linear feedback shift registers

KW - Primitive polynomial

KW - Serial input shift register

KW - System on chip

UR - http://www.scopus.com/inward/record.url?scp=77950413347&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77950413347&partnerID=8YFLogxK

U2 - 10.1109/IDT.2009.5404091

DO - 10.1109/IDT.2009.5404091

M3 - Conference contribution

AN - SCOPUS:77950413347

SN - 9781424457489

T3 - 2009 4th International Design and Test Workshop, IDT 2009

BT - 2009 4th International Design and Test Workshop, IDT 2009

T2 - 2009 4th International Design and Test Workshop, IDT 2009

Y2 - 15 November 2009 through 17 November 2009

ER -

How to design an effective Serial Input Shift Register (SISR) for data compression process of built-in self-test methodology

Abstract

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Keywords

ASJC Scopus subject areas

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