High speed pipelined pattern recognition

C. Fordham*, I. Ali, B. Behrens, C. Foudas, A. Goussiou, M. Jaworski, S. Silverstein, W. H. Smith, U. Wisconsin, J. Dawson, D. Krakauer, R. L. Talaga

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Engineering & Materials Science