Enhanced resolution in magnetic force microscropy using tips with perpendicular magnetic anisotropy

S. N. Piramanayagam, M. Ranjbar, E. L. Tan, H. K. Tan, R. Sbiaa, T. C. Chong

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

Magnetic force microscopy (MFM) is commonly used for the characterization of magnetic nanostructures, which gets challenging for sub-20 nm features. The typical resolution of commercial MFM tips stands at about 30 nm, whereas sub-15 nm resolution has been reported by extensive modifications of the tip. In this paper, we show that a tip coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA) offers superior resolution compared to tips without PMA. The advantages of a tip with PMA have been demonstrated based on writing magnetic transitions in a commercial perpendicular media. MFM images and line scans at different scan heights are presented along with an explanation for the observed improvement in performance.

Original languageEnglish
Article number07E326
JournalJournal of Applied Physics
Volume109
Issue number7
DOIs
Publication statusPublished - Apr 1 2011

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magnetic force microscopy
anisotropy
magnetic films

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Enhanced resolution in magnetic force microscropy using tips with perpendicular magnetic anisotropy. / Piramanayagam, S. N.; Ranjbar, M.; Tan, E. L.; Tan, H. K.; Sbiaa, R.; Chong, T. C.

In: Journal of Applied Physics, Vol. 109, No. 7, 07E326, 01.04.2011.

Research output: Contribution to journalArticle

Piramanayagam, S. N. ; Ranjbar, M. ; Tan, E. L. ; Tan, H. K. ; Sbiaa, R. ; Chong, T. C. / Enhanced resolution in magnetic force microscropy using tips with perpendicular magnetic anisotropy. In: Journal of Applied Physics. 2011 ; Vol. 109, No. 7.
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