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Effect of temperature and inhomogeneity on the yield of PtSi-n-Si photodetectors
A. Sellai
*
, P. Dawson
*
Corresponding author for this work
Physics
Research output
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Contribution to journal
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Conference article
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peer-review
10
Citations (Scopus)
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Physics
Inhomogeneity
100%
Photometer
50%
Temperature Dependence
50%
Thermionic Emission
50%
Material Science
Current Voltage Characteristics
50%