Determination of the variation in sputter yield in the SIMS transient region using MEIS

M. G. Dowsett^*, T. J. Ormsby, F. S. Gard, S. H. Al-Harthi, B. Guzmán, C. F. McConville, T. C.Q. Noakes, P. Bailey

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review