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Dive into the research topics of 'Deep-level transient spectroscopy study of the E center in n-Si and partially relaxed n- Si0.9 Ge0.1 alloy layers'. Together they form a unique fingerprint.- Sort by
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M. Mamor*, M. Elzain, K. Bouziane, S. H. Al Harthi
Research output: Contribution to journal › Article › peer-review