Construction and operation of a simple electronic speckle pattern interferometer and its use in measuring microscopic deformations

K. M. Abedin; S. A. Jesmin; A. F.M.Y. Haider

doi:10.1016/S0030-3992(00)00074-8

Construction and operation of a simple electronic speckle pattern interferometer and its use in measuring microscopic deformations

K. M. Abedin^*, S. A. Jesmin, A. F.M.Y. Haider

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

Abstract

The construction and operation of a simple electronic speckle pattern interferometer (ESPI) is described. The underlying theory behind the operation of the interferometer, which is sensitive to out-of-plane displacements, is given. The interferometer uses a commercial digital still camera for image acquisition and a personal computer for image storage and analysis. The interferometer was used to measure microscopic deformations of a steel plate caused by small loads. The results were found to be in good agreement with the predictions of the elastic theory. Various possible applications of the interferometer are mentioned.

Original language	English
Pages (from-to)	323-328
Number of pages	6
Journal	Optics and Laser Technology
Volume	32
Issue number	5
DOIs	https://doi.org/10.1016/S0030-3992(00)00074-8
Publication status	Published - Jul 2000
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

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10.1016/S0030-3992(00)00074-8

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AB - The construction and operation of a simple electronic speckle pattern interferometer (ESPI) is described. The underlying theory behind the operation of the interferometer, which is sensitive to out-of-plane displacements, is given. The interferometer uses a commercial digital still camera for image acquisition and a personal computer for image storage and analysis. The interferometer was used to measure microscopic deformations of a steel plate caused by small loads. The results were found to be in good agreement with the predictions of the elastic theory. Various possible applications of the interferometer are mentioned.

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Construction and operation of a simple electronic speckle pattern interferometer and its use in measuring microscopic deformations

Abstract

ASJC Scopus subject areas

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