Construction and operation of a simple electronic speckle pattern interferometer and its use in measuring microscopic deformations

K. M. Abedin, S. A. Jesmin, A. F.M.Y. Haider

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

The construction and operation of a simple electronic speckle pattern interferometer (ESPI) is described. The underlying theory behind the operation of the interferometer, which is sensitive to out-of-plane displacements, is given. The interferometer uses a commercial digital still camera for image acquisition and a personal computer for image storage and analysis. The interferometer was used to measure microscopic deformations of a steel plate caused by small loads. The results were found to be in good agreement with the predictions of the elastic theory. Various possible applications of the interferometer are mentioned.

Original languageEnglish
Pages (from-to)323-328
Number of pages6
JournalOptics and Laser Technology
Volume32
Issue number5
DOIs
Publication statusPublished - 2000

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speckle patterns
Speckle
Interferometers
interferometers
electronics
Image acquisition
Steel
personal computers
Digital cameras
Personal computers
acquisition
cameras
steels
predictions

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

Construction and operation of a simple electronic speckle pattern interferometer and its use in measuring microscopic deformations. / Abedin, K. M.; Jesmin, S. A.; Haider, A. F.M.Y.

In: Optics and Laser Technology, Vol. 32, No. 5, 2000, p. 323-328.

Research output: Contribution to journalArticle

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