Construction and operation of a simple electronic speckle pattern interferometer and its use in measuring microscopic deformations

K. M. Abedin, S. A. Jesmin, A. F.M.Y. Haider

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

The construction and operation of a simple electronic speckle pattern interferometer (ESPI) is described. The underlying theory behind the operation of the interferometer, which is sensitive to out-of-plane displacements, is given. The interferometer uses a commercial digital still camera for image acquisition and a personal computer for image storage and analysis. The interferometer was used to measure microscopic deformations of a steel plate caused by small loads. The results were found to be in good agreement with the predictions of the elastic theory. Various possible applications of the interferometer are mentioned.

Original languageEnglish
Pages (from-to)323-328
Number of pages6
JournalOptics and Laser Technology
Volume32
Issue number5
DOIs
Publication statusPublished - 2000

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Construction and operation of a simple electronic speckle pattern interferometer and its use in measuring microscopic deformations'. Together they form a unique fingerprint.

  • Cite this