Constant error masking behavior of an internal exclusive-OR type signature analyzer due to the changed polynomial seeds

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Constant error masking behavior of an internal exclusive-OR type signature analyzer due to the changed polynomial seeds was analyzed. Simulation study showed that the change of the polynomial seed does not any have impact on the effectiveness of the internal exclusive-OR type siganture analyzer used in the linear feedback shift registers (LFSR). It was found that the counts of the error masks remained unchanged due to the change of the seeds.

Original languageEnglish
Pages (from-to)577-585
Number of pages9
JournalComputers and Electrical Engineering
Volume28
Issue number6
DOIs
Publication statusPublished - Nov 2002

Keywords

  • BIST
  • Digital circuit testing
  • Error masking
  • Internal exclusive OR
  • LFSR
  • Polynomial seeds
  • Pseudo-random test patterns
  • Signature analyzer

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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