Coaxial D-dot probe

design and testing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

22 Citations (Scopus)

Abstract

A new coaxial D-dot probe is designed and calibrated. A charge simulation programme is used to get the best configuration and arrangement of the probe design. The calibration is made against a conventional capacitive divider. The designed probe shows faster response and eliminate the inductive overshoot to some extent. Coaxial D-dot probes are the ideal method for fast transient measurement; especially, for these tests which incorporate high energy as for testing ZnO varistors, arresters, or arrester element(s). Examples of such test are also introduced.

Original languageEnglish
Title of host publicationConference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report
PublisherIEEE
Pages298-301
Number of pages4
Publication statusPublished - 1995
EventProceedings of the 1995 Conference on Electrical Insulation and Dielectric Phenomena - Virginia Beach, VA, USA
Duration: Oct 22 1995Oct 25 1995

Other

OtherProceedings of the 1995 Conference on Electrical Insulation and Dielectric Phenomena
CityVirginia Beach, VA, USA
Period10/22/9510/25/95

Fingerprint

Testing
Varistors
Calibration

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering
  • Building and Construction

Cite this

Metwally, I. A. (1995). Coaxial D-dot probe: design and testing. In Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report (pp. 298-301). IEEE.

Coaxial D-dot probe : design and testing. / Metwally, I. A.

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. IEEE, 1995. p. 298-301.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Metwally, IA 1995, Coaxial D-dot probe: design and testing. in Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. IEEE, pp. 298-301, Proceedings of the 1995 Conference on Electrical Insulation and Dielectric Phenomena, Virginia Beach, VA, USA, 10/22/95.
Metwally IA. Coaxial D-dot probe: design and testing. In Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. IEEE. 1995. p. 298-301
Metwally, I. A. / Coaxial D-dot probe : design and testing. Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. IEEE, 1995. pp. 298-301
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