Abstract
A new coaxial D-dot probe is designed and calibrated. A charge simulation programme is used to get the best configuration and arrangement of the probe design. The calibration is made against a conventional capacitive divider. The designed probe shows faster response and eliminate the inductive overshoot to some extent. Coaxial D-dot probes are the ideal method for fast transient measurement; especially, for these tests which incorporate high energy as for testing ZnO varistors, arresters, or arrester element(s). Examples of such test are also introduced.
| Original language | English |
|---|---|
| Pages (from-to) | 298-301 |
| Number of pages | 4 |
| Journal | Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report |
| Publication status | Published - 1995 |
| Externally published | Yes |
| Event | Proceedings of the 1995 Conference on Electrical Insulation and Dielectric Phenomena - Virginia Beach, VA, USA Duration: Oct 22 1995 → Oct 25 1995 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering
- Building and Construction