Abstract
A new coaxial D-dot probe is designed and calibrated. A charge simulation programme is used to get the best configuration and arrangement of the probe design. The calibration is made against a conventional capacitive divider. The designed probe shows faster response and eliminate the inductive overshoot to some extent. Coaxial D-dot probes are the ideal method for fast transient measurement; especially, for these tests which incorporate high energy as for testing ZnO varistors, arresters, or arrester element(s). Examples of such test are also introduced.
| Original language | English |
|---|---|
| Title of host publication | Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report |
| Publisher | IEEE |
| Pages | 298-301 |
| Number of pages | 4 |
| Publication status | Published - 1995 |
| Event | Proceedings of the 1995 Conference on Electrical Insulation and Dielectric Phenomena - Virginia Beach, VA, USA Duration: Oct 22 1995 → Oct 25 1995 |
Other
| Other | Proceedings of the 1995 Conference on Electrical Insulation and Dielectric Phenomena |
|---|---|
| City | Virginia Beach, VA, USA |
| Period | 10/22/95 → 10/25/95 |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering
- Building and Construction
Cite this
Metwally, I. A. (1995). Coaxial D-dot probe: design and testing. In Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report (pp. 298-301). IEEE.