Coaxial D-dot probe: design and testing

I. A. Metwally*

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

25 Citations (Scopus)

Abstract

A new coaxial D-dot probe is designed and calibrated. A charge simulation programme is used to get the best configuration and arrangement of the probe design. The calibration is made against a conventional capacitive divider. The designed probe shows faster response and eliminate the inductive overshoot to some extent. Coaxial D-dot probes are the ideal method for fast transient measurement; especially, for these tests which incorporate high energy as for testing ZnO varistors, arresters, or arrester element(s). Examples of such test are also introduced.

Original languageEnglish
Pages (from-to)298-301
Number of pages4
JournalConference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report
Publication statusPublished - 1995
Externally publishedYes
EventProceedings of the 1995 Conference on Electrical Insulation and Dielectric Phenomena - Virginia Beach, VA, USA
Duration: Oct 22 1995Oct 25 1995

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering
  • Building and Construction

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