Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy

S. N. Piramanayagam, M. Ranjbar, R. Sbiaa, K. G A Tavakkoli, T. C. Chong

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Bit-patterned media at one terabit-per-square-inch (Tb/in 2) recording density require a feature size of about 12 nm. The fabrication and characterization of such magnetic nanostructures is still a challenge. In this Letter, we show that magnetic dots can be resolved at 10 nm spacing using magnetic force microscopy (MFM) tips coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA). Compared to MFM tips with no special magnetic anisotropy, MFM tips with PMA can resolve the bits clearly, because of a smaller magnetic interaction volume, enabling a simple technique for characterizing fine magnetic nanostructures.

Original languageEnglish
Pages (from-to)141-143
Number of pages3
JournalPhysica Status Solidi - Rapid Research Letters
Volume6
Issue number3
DOIs
Publication statusPublished - Mar 2012

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Keywords

  • Bit-patterned media
  • Magnetic force microscopy
  • Nanostructures
  • Perpendicular magnetic anisotropy

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Materials Science(all)

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