Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy

S. N. Piramanayagam; M. Ranjbar; R. Sbiaa; K. G.A. Tavakkoli; T. C. Chong

doi:10.1002/pssr.201105537

Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy

S. N. Piramanayagam^*, M. Ranjbar, R. Sbiaa, K. G.A. Tavakkoli, T. C. Chong

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

Bit-patterned media at one terabit-per-square-inch (Tb/in ²) recording density require a feature size of about 12 nm. The fabrication and characterization of such magnetic nanostructures is still a challenge. In this Letter, we show that magnetic dots can be resolved at 10 nm spacing using magnetic force microscopy (MFM) tips coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA). Compared to MFM tips with no special magnetic anisotropy, MFM tips with PMA can resolve the bits clearly, because of a smaller magnetic interaction volume, enabling a simple technique for characterizing fine magnetic nanostructures.

Original language	English
Pages (from-to)	141-143
Number of pages	3
Journal	Physica Status Solidi - Rapid Research Letters
Volume	6
Issue number	3
DOIs	https://doi.org/10.1002/pssr.201105537
Publication status	Published - Mar 2012
Externally published	Yes

Keywords

Bit-patterned media
Magnetic force microscopy
Nanostructures
Perpendicular magnetic anisotropy

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics

Access to Document

10.1002/pssr.201105537

Cite this

@article{407bd46b343c457d8e72c605624cee8c,

title = "Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy",

abstract = "Bit-patterned media at one terabit-per-square-inch (Tb/in 2) recording density require a feature size of about 12 nm. The fabrication and characterization of such magnetic nanostructures is still a challenge. In this Letter, we show that magnetic dots can be resolved at 10 nm spacing using magnetic force microscopy (MFM) tips coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA). Compared to MFM tips with no special magnetic anisotropy, MFM tips with PMA can resolve the bits clearly, because of a smaller magnetic interaction volume, enabling a simple technique for characterizing fine magnetic nanostructures.",

keywords = "Bit-patterned media, Magnetic force microscopy, Nanostructures, Perpendicular magnetic anisotropy",

author = "Piramanayagam, {S. N.} and M. Ranjbar and R. Sbiaa and Tavakkoli, {K. G.A.} and Chong, {T. C.}",

year = "2012",

month = mar,

doi = "10.1002/pssr.201105537",

language = "English",

volume = "6",

pages = "141--143",

journal = "Physica Status Solidi - Rapid Research Letters",

issn = "1862-6254",

publisher = "Wiley-VCH Verlag",

number = "3",

}

TY - JOUR

T1 - Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy

AU - Piramanayagam, S. N.

AU - Ranjbar, M.

AU - Sbiaa, R.

AU - Tavakkoli, K. G.A.

AU - Chong, T. C.

PY - 2012/3

Y1 - 2012/3

N2 - Bit-patterned media at one terabit-per-square-inch (Tb/in 2) recording density require a feature size of about 12 nm. The fabrication and characterization of such magnetic nanostructures is still a challenge. In this Letter, we show that magnetic dots can be resolved at 10 nm spacing using magnetic force microscopy (MFM) tips coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA). Compared to MFM tips with no special magnetic anisotropy, MFM tips with PMA can resolve the bits clearly, because of a smaller magnetic interaction volume, enabling a simple technique for characterizing fine magnetic nanostructures.

AB - Bit-patterned media at one terabit-per-square-inch (Tb/in 2) recording density require a feature size of about 12 nm. The fabrication and characterization of such magnetic nanostructures is still a challenge. In this Letter, we show that magnetic dots can be resolved at 10 nm spacing using magnetic force microscopy (MFM) tips coated with a magnetic film possessing a perpendicular magnetic anisotropy (PMA). Compared to MFM tips with no special magnetic anisotropy, MFM tips with PMA can resolve the bits clearly, because of a smaller magnetic interaction volume, enabling a simple technique for characterizing fine magnetic nanostructures.

KW - Bit-patterned media

KW - Magnetic force microscopy

KW - Nanostructures

KW - Perpendicular magnetic anisotropy

UR - http://www.scopus.com/inward/record.url?scp=84857599852&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84857599852&partnerID=8YFLogxK

U2 - 10.1002/pssr.201105537

DO - 10.1002/pssr.201105537

M3 - Article

AN - SCOPUS:84857599852

SN - 1862-6254

VL - 6

SP - 141

EP - 143

JO - Physica Status Solidi - Rapid Research Letters

JF - Physica Status Solidi - Rapid Research Letters

IS - 3

ER -

Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this