Challenges for test and fault-tolerance due to convergence of electronics, semiconductor systems and computing

Research output: Contribution to conferencePaper

1 Citation (Scopus)

Abstract

Convergence of electronics, semiconductor
systems and computing are rapidly transforming society at
much faster pace than incorporation fault-tolerance and test
methodologies in the systems. Further, underlying hardware
and software in communication, security, quality of life,
health, economic or financial well-being systems are
increasingly being used for making decisions that influence
individual and society. Consequently, it is imperative that
the underlying hardware and software perform correctly
and be defect free. However, to achieve zero defect through
testing, screening and incorporation of redundancies is
extremely challenging. This is what exactly the theme of my
talk. During my presentation I will touch upon the
mechanisms and issues to cope with the challenges.

Conference

Conference2017 International Conference on Infocom Technologies and Unmanned Systems (Trends and Future Directions) (ICTUS)
CountryUnited Arab Emirates
CityDubai
Period12/18/1712/20/17
Internet address

Fingerprint

Fault tolerance
Electronic equipment
Semiconductor materials
Defects
Redundancy
Screening
Decision making
Health
Hardware
Economics
Secure communication

Cite this

Ahmad, A. (2018). Challenges for test and fault-tolerance due to convergence of electronics, semiconductor systems and computing. 64-68. Paper presented at 2017 International Conference on Infocom Technologies and Unmanned Systems (Trends and Future Directions) (ICTUS), Dubai, United Arab Emirates.

Challenges for test and fault-tolerance due to convergence of electronics, semiconductor systems and computing. / Ahmad, Afaq.

2018. 64-68 Paper presented at 2017 International Conference on Infocom Technologies and Unmanned Systems (Trends and Future Directions) (ICTUS), Dubai, United Arab Emirates.

Research output: Contribution to conferencePaper

Ahmad, A 2018, 'Challenges for test and fault-tolerance due to convergence of electronics, semiconductor systems and computing' Paper presented at 2017 International Conference on Infocom Technologies and Unmanned Systems (Trends and Future Directions) (ICTUS), Dubai, United Arab Emirates, 12/18/17 - 12/20/17, pp. 64-68.
Ahmad A. Challenges for test and fault-tolerance due to convergence of electronics, semiconductor systems and computing. 2018. Paper presented at 2017 International Conference on Infocom Technologies and Unmanned Systems (Trends and Future Directions) (ICTUS), Dubai, United Arab Emirates.
Ahmad, Afaq. / Challenges for test and fault-tolerance due to convergence of electronics, semiconductor systems and computing. Paper presented at 2017 International Conference on Infocom Technologies and Unmanned Systems (Trends and Future Directions) (ICTUS), Dubai, United Arab Emirates.5 p.
@conference{70bbf9e1042f454283e94deba09cdf62,
title = "Challenges for test and fault-tolerance due to convergence of electronics, semiconductor systems and computing",
abstract = "Convergence of electronics, semiconductorsystems and computing are rapidly transforming society atmuch faster pace than incorporation fault-tolerance and testmethodologies in the systems. Further, underlying hardwareand software in communication, security, quality of life,health, economic or financial well-being systems areincreasingly being used for making decisions that influenceindividual and society. Consequently, it is imperative thatthe underlying hardware and software perform correctlyand be defect free. However, to achieve zero defect throughtesting, screening and incorporation of redundancies isextremely challenging. This is what exactly the theme of mytalk. During my presentation I will touch upon themechanisms and issues to cope with the challenges.",
author = "Afaq Ahmad",
year = "2018",
language = "English",
pages = "64--68",
note = "2017 International Conference on Infocom Technologies and Unmanned Systems (Trends and Future Directions) (ICTUS) ; Conference date: 18-12-2017 Through 20-12-2017",
url = "http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?&filter{\%}3DAND{\%}28p_IS_Number{\%}3A8285955{\%}29&searchWithin=Afaq{\%}20Ahmad&pageNumber=1&resultAction=REFINE",

}

TY - CONF

T1 - Challenges for test and fault-tolerance due to convergence of electronics, semiconductor systems and computing

AU - Ahmad, Afaq

PY - 2018

Y1 - 2018

N2 - Convergence of electronics, semiconductorsystems and computing are rapidly transforming society atmuch faster pace than incorporation fault-tolerance and testmethodologies in the systems. Further, underlying hardwareand software in communication, security, quality of life,health, economic or financial well-being systems areincreasingly being used for making decisions that influenceindividual and society. Consequently, it is imperative thatthe underlying hardware and software perform correctlyand be defect free. However, to achieve zero defect throughtesting, screening and incorporation of redundancies isextremely challenging. This is what exactly the theme of mytalk. During my presentation I will touch upon themechanisms and issues to cope with the challenges.

AB - Convergence of electronics, semiconductorsystems and computing are rapidly transforming society atmuch faster pace than incorporation fault-tolerance and testmethodologies in the systems. Further, underlying hardwareand software in communication, security, quality of life,health, economic or financial well-being systems areincreasingly being used for making decisions that influenceindividual and society. Consequently, it is imperative thatthe underlying hardware and software perform correctlyand be defect free. However, to achieve zero defect throughtesting, screening and incorporation of redundancies isextremely challenging. This is what exactly the theme of mytalk. During my presentation I will touch upon themechanisms and issues to cope with the challenges.

M3 - Paper

SP - 64

EP - 68

ER -