Challenges for test and fault-tolerance due to convergence of electronics, semiconductor systems and computing

Research output: Contribution to conferencePaper

1 Citation (Scopus)

Abstract

Convergence of electronics, semiconductor
systems and computing are rapidly transforming society at
much faster pace than incorporation fault-tolerance and test
methodologies in the systems. Further, underlying hardware
and software in communication, security, quality of life,
health, economic or financial well-being systems are
increasingly being used for making decisions that influence
individual and society. Consequently, it is imperative that
the underlying hardware and software perform correctly
and be defect free. However, to achieve zero defect through
testing, screening and incorporation of redundancies is
extremely challenging. This is what exactly the theme of my
talk. During my presentation I will touch upon the
mechanisms and issues to cope with the challenges.

Conference

Conference2017 International Conference on Infocom Technologies and Unmanned Systems (Trends and Future Directions) (ICTUS)
CountryUnited Arab Emirates
CityDubai
Period12/18/1712/20/17
Internet address

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Cite this

Ahmad, A. (2018). Challenges for test and fault-tolerance due to convergence of electronics, semiconductor systems and computing. 64-68. Paper presented at 2017 International Conference on Infocom Technologies and Unmanned Systems (Trends and Future Directions) (ICTUS), Dubai, United Arab Emirates.