C-AFM as a means to identify heterogeneities at the nanoscale in thin anodic TiO2 films

M. V. Diamanti, T. Souier, M. Chiesa, M. P. Pedeferri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'C-AFM as a means to identify heterogeneities at the nanoscale in thin anodic TiO2 films'. Together they form a unique fingerprint.

Engineering

Material Science