C-AFM as a means to identify heterogeneities at the nanoscale in thin anodic TiO2 films

M. V. Diamanti, T. Souier, M. Chiesa, M. P. Pedeferri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The anodic oxidation of titanium allows the obtaining of an oxide layer with thickness. color, homogeneity and insulating properties that depend on the process parameters imposed. These thin films have been studied mostly to derive information on the oxidation kinetics of the metal. Still, a deeper understanding of oxide properties is vital to open the way to engineered applications of nanostructured Ti02 films, such as in the most recent field of memristive devices, where a precise control of oxide thickness and its electrical properties is required. In this work, titanium was anodized in diluted sulfuric acid, with cell voltage ranging from 0 to 20 V. Oxide thickness was estimated by coulometric and spectrophotometric measurements; these two techniques were then combined with C-AFM to gain a deeper understanding of the oxide coverage of the metal surface and of the presence of crystal nano-domains within amorphous oxide phase.

Original languageEnglish
Title of host publicationTechnical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013
Pages117-120
Number of pages4
Volume1
Publication statusPublished - 2013
EventNanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013 - Washington, DC, United States
Duration: May 12 2013May 16 2013

Other

OtherNanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013
CountryUnited States
CityWashington, DC
Period5/12/135/16/13

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Oxides
Titanium
Metals
Color
Equipment and Supplies

Keywords

  • Anodizing
  • Conductivity
  • Thickness
  • Titanium oxide

ASJC Scopus subject areas

  • Biotechnology

Cite this

Diamanti, M. V., Souier, T., Chiesa, M., & Pedeferri, M. P. (2013). C-AFM as a means to identify heterogeneities at the nanoscale in thin anodic TiO2 films. In Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013 (Vol. 1, pp. 117-120)

C-AFM as a means to identify heterogeneities at the nanoscale in thin anodic TiO2 films. / Diamanti, M. V.; Souier, T.; Chiesa, M.; Pedeferri, M. P.

Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013. Vol. 1 2013. p. 117-120.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Diamanti, MV, Souier, T, Chiesa, M & Pedeferri, MP 2013, C-AFM as a means to identify heterogeneities at the nanoscale in thin anodic TiO2 films. in Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013. vol. 1, pp. 117-120, Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013, Washington, DC, United States, 5/12/13.
Diamanti MV, Souier T, Chiesa M, Pedeferri MP. C-AFM as a means to identify heterogeneities at the nanoscale in thin anodic TiO2 films. In Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013. Vol. 1. 2013. p. 117-120
Diamanti, M. V. ; Souier, T. ; Chiesa, M. ; Pedeferri, M. P. / C-AFM as a means to identify heterogeneities at the nanoscale in thin anodic TiO2 films. Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013. Vol. 1 2013. pp. 117-120
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