TY - JOUR
T1 - Buffer effect on GMR in thin Co/Cu multilayers
AU - Bouziane, K.
AU - Rawas, A. D.Al
AU - Maaza, M.
AU - Mamor, M.
N1 - Funding Information:
Two authors (K.B. and A.D.R.) would like to thank DOPSAR Project #IG/SCI/PHYS/00/05, Sultan Qaboos University, Oman, and the WITS University (South Africa) for their financial support.
PY - 2006/4/13
Y1 - 2006/4/13
N2 - [Co(1.1 nm)/Cu(0.9 nm)]×25 multilayers (MLs) with different textures and interfacial Co-Cu roughness have been obtained by depositing them on different buffer layers (Fe, Cr, Cu, Co, Ta or Al) 8 nm thick using an unusual RF sputtering method. An attempt has been made to understand the correlation between the interfacial roughness and giant magnetoresistance (GMR) from the magnetic properties of Co/Cu MLs. It has been observed that high GMR is weakly dependent on the texture of MLs. High GMR has been observed in either in weakly textured (2 0 0) Co/Cu MLs (GMR ∼ 45%) or strongly oriented (1 1 1) Co/Cu MLs (GMR ∼ 30%). However, a strong correlation between interfacial roughness and magneto-transport properties of sputtered Co/Cu(0.9 nm) MLs (corresponding to the first maximum of antiferromagnetic exchange coupling) has been determined. Contribution to GMR from superparamagnetic (SPM) interfacial region has been analyzed in terms of the Langevin function and also the expected standard linear dependence of GMR versus (M/Ms)2 for magnetoresistive granular-type Co-Cu system.
AB - [Co(1.1 nm)/Cu(0.9 nm)]×25 multilayers (MLs) with different textures and interfacial Co-Cu roughness have been obtained by depositing them on different buffer layers (Fe, Cr, Cu, Co, Ta or Al) 8 nm thick using an unusual RF sputtering method. An attempt has been made to understand the correlation between the interfacial roughness and giant magnetoresistance (GMR) from the magnetic properties of Co/Cu MLs. It has been observed that high GMR is weakly dependent on the texture of MLs. High GMR has been observed in either in weakly textured (2 0 0) Co/Cu MLs (GMR ∼ 45%) or strongly oriented (1 1 1) Co/Cu MLs (GMR ∼ 30%). However, a strong correlation between interfacial roughness and magneto-transport properties of sputtered Co/Cu(0.9 nm) MLs (corresponding to the first maximum of antiferromagnetic exchange coupling) has been determined. Contribution to GMR from superparamagnetic (SPM) interfacial region has been analyzed in terms of the Langevin function and also the expected standard linear dependence of GMR versus (M/Ms)2 for magnetoresistive granular-type Co-Cu system.
KW - Buffer effect
KW - Co/Cu multilayer structure
KW - Electrical properties
KW - Interfacial roughness
KW - Magnetic materials
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U2 - 10.1016/j.jallcom.2005.07.038
DO - 10.1016/j.jallcom.2005.07.038
M3 - Article
AN - SCOPUS:33646490982
SN - 0925-8388
VL - 414
SP - 42
EP - 47
JO - Journal of Alloys and Compounds
JF - Journal of Alloys and Compounds
IS - 1-2
ER -