Bit Swapped Test Technique with Statistical Signal Properties for EVS Applications

Afaq Ahmad

Bit Swapped Test Technique with Statistical Signal Properties for EVS Applications

Electrical and Computer Engineering

Research output: Contribution to conference › Paper › peer-review

Abstract

Keynote/Invited talk: The intent of this talk is to introduce the idea of a new scheme devised to reduce test power, with employment of a low-transition test pattern generator. Various techniques have been proposed to reduce the test power such as Bit Insertion, Bit swapping. In the proposed scheme, Bit Swapping technique is integrated with pseudorandom signal analyzer to make the further reduction in the test power. A hardware complexity estimation for testing Embedded Vision Systems (EVS) will also be discussed.

Original language	English
Publication status	Published - Aug 25 2022
Event	Conference: Keynote/Invited talk - 9th International Conference on Signal Processing and Integrated Networks (SPIN2022) 25-26 August 2022, Amity University, Delhi-NCR, IndiaAt: Amity University, Delhi-NCR, India - Noida, India Duration: Aug 25 2022 → Aug 26 2022

Conference

Conference	Conference: Keynote/Invited talk - 9th International Conference on Signal Processing and Integrated Networks (SPIN2022) 25-26 August 2022, Amity University, Delhi-NCR, IndiaAt: Amity University, Delhi-NCR, India
Country/Territory	India
City	Noida
Period	8/25/22 → 8/26/22

Cite this

Bit Swapped Test Technique with Statistical Signal Properties for EVS Applications. / Ahmad, Afaq.
2022. Paper presented at Conference: Keynote/Invited talk - 9th International Conference on Signal Processing and Integrated Networks (SPIN2022) 25-26 August 2022, Amity University, Delhi-NCR, IndiaAt: Amity University, Delhi-NCR, India, Noida, India.

Research output: Contribution to conference › Paper › peer-review

@conference{b0f71585ee514c9dbd28d24e0aab7798,

title = "Bit Swapped Test Technique with Statistical Signal Properties for EVS Applications",

abstract = "Keynote/Invited talk: The intent of this talk is to introduce the idea of a new scheme devised to reduce test power, with employment of a low-transition test pattern generator. Various techniques have been proposed to reduce the test power such as Bit Insertion, Bit swapping. In the proposed scheme, Bit Swapping technique is integrated with pseudorandom signal analyzer to make the further reduction in the test power. A hardware complexity estimation for testing Embedded Vision Systems (EVS) will also be discussed.",

author = "Afaq Ahmad",

year = "2022",

month = aug,

day = "25",

language = "English",

note = "Conference: Keynote/Invited talk - 9th International Conference on Signal Processing and Integrated Networks (SPIN2022) 25-26 August 2022, Amity University, Delhi-NCR, IndiaAt: Amity University, Delhi-NCR, India ; Conference date: 25-08-2022 Through 26-08-2022",

}

TY - CONF

T1 - Bit Swapped Test Technique with Statistical Signal Properties for EVS Applications

AU - Ahmad, Afaq

PY - 2022/8/25

Y1 - 2022/8/25

N2 - Keynote/Invited talk: The intent of this talk is to introduce the idea of a new scheme devised to reduce test power, with employment of a low-transition test pattern generator. Various techniques have been proposed to reduce the test power such as Bit Insertion, Bit swapping. In the proposed scheme, Bit Swapping technique is integrated with pseudorandom signal analyzer to make the further reduction in the test power. A hardware complexity estimation for testing Embedded Vision Systems (EVS) will also be discussed.

AB - Keynote/Invited talk: The intent of this talk is to introduce the idea of a new scheme devised to reduce test power, with employment of a low-transition test pattern generator. Various techniques have been proposed to reduce the test power such as Bit Insertion, Bit swapping. In the proposed scheme, Bit Swapping technique is integrated with pseudorandom signal analyzer to make the further reduction in the test power. A hardware complexity estimation for testing Embedded Vision Systems (EVS) will also be discussed.

M3 - Paper

T2 - Conference: Keynote/Invited talk - 9th International Conference on Signal Processing and Integrated Networks (SPIN2022) 25-26 August 2022, Amity University, Delhi-NCR, IndiaAt: Amity University, Delhi-NCR, India

Y2 - 25 August 2022 through 26 August 2022

ER -