Abstract
High-resolution studies of a beam-sensitive, transition-metal-containing poly-yne have indicated an unusual beam damage mechanism which conforms to a random-hit model rather than to the more usual mechanism whereby damage is initiated at faults and crystal edges. We present details of the low-dose, high-resolution techniques used and propose a model for damage in this unusual polymer.
Original language | English |
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Pages (from-to) | 83-88 |
Number of pages | 6 |
Journal | Ultramicroscopy |
Volume | 41 |
Issue number | 1-3 |
DOIs | |
Publication status | Published - 1992 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation