Application of low dose techniques to structure determination in a transition metal-containing poly-yne

A. E. Dray*, A. M. Donald, R. H. Friend, M. S. Khan, J. Lewis, R. Rachel, W. O. Saxton

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Organometallic polymers have potential applications in opto-electronics but full understanding and utilisation of their properties requires knowledge of the polymer structure and possible structural defects. In this work we present a summary of results obtained using high resolution electron microscopy (HREM) and a variety of low dose techniques in order to obtain lattice images of a well crystallised, beam sensitive Pt-containing poly-yne. Many details of the unit cell and of typical lattice defects have been obtained via HREM on a polymer system for which single crystal x-ray diffractometry has proved impossible.

Original languageEnglish
Title of host publicationInstitute of Physics Conference Series
PublisherPubl by IOP Publishing Ltd
Pages349-352
Number of pages4
ISBN (Print)0854984089
Publication statusPublished - 1991
Externally publishedYes
EventProceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference - Bristol, Engl
Duration: Sept 10 1991Sept 13 1991

Publication series

NameInstitute of Physics Conference Series
Volume119
ISSN (Print)0951-3248

Other

OtherProceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference
CityBristol, Engl
Period9/10/919/13/91

ASJC Scopus subject areas

  • General Physics and Astronomy

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