Abstract
Organometallic polymers have potential applications in opto-electronics but full understanding and utilisation of their properties requires knowledge of the polymer structure and possible structural defects. In this work we present a summary of results obtained using high resolution electron microscopy (HREM) and a variety of low dose techniques in order to obtain lattice images of a well crystallised, beam sensitive Pt-containing poly-yne. Many details of the unit cell and of typical lattice defects have been obtained via HREM on a polymer system for which single crystal x-ray diffractometry has proved impossible.
Original language | English |
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Title of host publication | Institute of Physics Conference Series |
Publisher | Publ by IOP Publishing Ltd |
Pages | 349-352 |
Number of pages | 4 |
Volume | 119 |
ISBN (Print) | 0854984089 |
Publication status | Published - 1991 |
Event | Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference - Bristol, Engl Duration: Sep 10 1991 → Sep 13 1991 |
Other
Other | Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference |
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City | Bristol, Engl |
Period | 9/10/91 → 9/13/91 |
ASJC Scopus subject areas
- Physics and Astronomy(all)