Abstract
Organometallic polymers have potential applications in opto-electronics but full understanding and utilisation of their properties requires knowledge of the polymer structure and possible structural defects. In this work we present a summary of results obtained using high resolution electron microscopy (HREM) and a variety of low dose techniques in order to obtain lattice images of a well crystallised, beam sensitive Pt-containing poly-yne. Many details of the unit cell and of typical lattice defects have been obtained via HREM on a polymer system for which single crystal x-ray diffractometry has proved impossible.
| Original language | English |
|---|---|
| Title of host publication | Institute of Physics Conference Series |
| Publisher | Publ by IOP Publishing Ltd |
| Pages | 349-352 |
| Number of pages | 4 |
| Volume | 119 |
| ISBN (Print) | 0854984089 |
| Publication status | Published - 1991 |
| Event | Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference - Bristol, Engl Duration: Sep 10 1991 → Sep 13 1991 |
Other
| Other | Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference |
|---|---|
| City | Bristol, Engl |
| Period | 9/10/91 → 9/13/91 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
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Dray, A. E., Donald, A. M., Friend, R. H., Khan, M. S., Lewis, J., Rachel, R., & Saxton, W. O. (1991). Application of low dose techniques to structure determination in a transition metal-containing poly-yne. In Institute of Physics Conference Series (Vol. 119, pp. 349-352). Publ by IOP Publishing Ltd.