Advanced magnetic force microscopy for high resolution magnetic imaging

M. Ranjbar, S. N. Piramanayagam, R. Sbiaa, T. C. Chong, I. Okamoto

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Magnetic force microscopy (MFM) is one of the primary imaging tools for studying magnetic nanostructures. The resolution of MFM has been considered as a main issue in characterizing magnetic nanostructures smaller than 30 nm; especially for high density recording media beyond 1 Tbit/in2. In this letter, we investigated three different kinds of MFM tips such as those with a perpendicular magnetic anisotropy (PMA) derived from a crystallographic texture, antiferromagnetic coupled perpendicular (AFC) tips and tips with no crystallographic textures, resulting in no PMA. Their resolution, as measured using a recording media with written information, was compared with that of commercial MFM tips. The tip in the PMA configuration was found to provide the best resolution among all of them.

Original languageEnglish
Pages (from-to)628-633
Number of pages6
JournalNanoscience and Nanotechnology Letters
Volume4
Issue number6
DOIs
Publication statusPublished - Jun 2012

Fingerprint

Magnetic force microscopy
Magnetic anisotropy
Imaging techniques
Nanostructures
Textures

Keywords

  • Antiferromagnetic coupling
  • Magnetic force microscopy
  • Perpendicular magnetic anisotropy

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Advanced magnetic force microscopy for high resolution magnetic imaging. / Ranjbar, M.; Piramanayagam, S. N.; Sbiaa, R.; Chong, T. C.; Okamoto, I.

In: Nanoscience and Nanotechnology Letters, Vol. 4, No. 6, 06.2012, p. 628-633.

Research output: Contribution to journalArticle

Ranjbar, M. ; Piramanayagam, S. N. ; Sbiaa, R. ; Chong, T. C. ; Okamoto, I. / Advanced magnetic force microscopy for high resolution magnetic imaging. In: Nanoscience and Nanotechnology Letters. 2012 ; Vol. 4, No. 6. pp. 628-633.
@article{90421c540d88449ebc30360192985d6d,
title = "Advanced magnetic force microscopy for high resolution magnetic imaging",
abstract = "Magnetic force microscopy (MFM) is one of the primary imaging tools for studying magnetic nanostructures. The resolution of MFM has been considered as a main issue in characterizing magnetic nanostructures smaller than 30 nm; especially for high density recording media beyond 1 Tbit/in2. In this letter, we investigated three different kinds of MFM tips such as those with a perpendicular magnetic anisotropy (PMA) derived from a crystallographic texture, antiferromagnetic coupled perpendicular (AFC) tips and tips with no crystallographic textures, resulting in no PMA. Their resolution, as measured using a recording media with written information, was compared with that of commercial MFM tips. The tip in the PMA configuration was found to provide the best resolution among all of them.",
keywords = "Antiferromagnetic coupling, Magnetic force microscopy, Perpendicular magnetic anisotropy",
author = "M. Ranjbar and Piramanayagam, {S. N.} and R. Sbiaa and Chong, {T. C.} and I. Okamoto",
year = "2012",
month = "6",
doi = "10.1166/nnl.2012.1367",
language = "English",
volume = "4",
pages = "628--633",
journal = "Nanoscience and Nanotechnology Letters",
issn = "1941-4900",
publisher = "American Scientific Publishers",
number = "6",

}

TY - JOUR

T1 - Advanced magnetic force microscopy for high resolution magnetic imaging

AU - Ranjbar, M.

AU - Piramanayagam, S. N.

AU - Sbiaa, R.

AU - Chong, T. C.

AU - Okamoto, I.

PY - 2012/6

Y1 - 2012/6

N2 - Magnetic force microscopy (MFM) is one of the primary imaging tools for studying magnetic nanostructures. The resolution of MFM has been considered as a main issue in characterizing magnetic nanostructures smaller than 30 nm; especially for high density recording media beyond 1 Tbit/in2. In this letter, we investigated three different kinds of MFM tips such as those with a perpendicular magnetic anisotropy (PMA) derived from a crystallographic texture, antiferromagnetic coupled perpendicular (AFC) tips and tips with no crystallographic textures, resulting in no PMA. Their resolution, as measured using a recording media with written information, was compared with that of commercial MFM tips. The tip in the PMA configuration was found to provide the best resolution among all of them.

AB - Magnetic force microscopy (MFM) is one of the primary imaging tools for studying magnetic nanostructures. The resolution of MFM has been considered as a main issue in characterizing magnetic nanostructures smaller than 30 nm; especially for high density recording media beyond 1 Tbit/in2. In this letter, we investigated three different kinds of MFM tips such as those with a perpendicular magnetic anisotropy (PMA) derived from a crystallographic texture, antiferromagnetic coupled perpendicular (AFC) tips and tips with no crystallographic textures, resulting in no PMA. Their resolution, as measured using a recording media with written information, was compared with that of commercial MFM tips. The tip in the PMA configuration was found to provide the best resolution among all of them.

KW - Antiferromagnetic coupling

KW - Magnetic force microscopy

KW - Perpendicular magnetic anisotropy

UR - http://www.scopus.com/inward/record.url?scp=84864841526&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84864841526&partnerID=8YFLogxK

U2 - 10.1166/nnl.2012.1367

DO - 10.1166/nnl.2012.1367

M3 - Article

VL - 4

SP - 628

EP - 633

JO - Nanoscience and Nanotechnology Letters

JF - Nanoscience and Nanotechnology Letters

SN - 1941-4900

IS - 6

ER -