Advanced magnetic force microscopy for high resolution magnetic imaging

M. Ranjbar; S. N. Piramanayagam; R. Sbiaa; T. C. Chong; I. Okamoto

doi:10.1166/nnl.2012.1367

Advanced magnetic force microscopy for high resolution magnetic imaging

M. Ranjbar, S. N. Piramanayagam^*, R. Sbiaa, T. C. Chong, I. Okamoto

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

Magnetic force microscopy (MFM) is one of the primary imaging tools for studying magnetic nanostructures. The resolution of MFM has been considered as a main issue in characterizing magnetic nanostructures smaller than 30 nm; especially for high density recording media beyond 1 Tbit/in2. In this letter, we investigated three different kinds of MFM tips such as those with a perpendicular magnetic anisotropy (PMA) derived from a crystallographic texture, antiferromagnetic coupled perpendicular (AFC) tips and tips with no crystallographic textures, resulting in no PMA. Their resolution, as measured using a recording media with written information, was compared with that of commercial MFM tips. The tip in the PMA configuration was found to provide the best resolution among all of them.

Original language	English
Pages (from-to)	628-633
Number of pages	6
Journal	Nanoscience and Nanotechnology Letters
Volume	4
Issue number	6
DOIs	https://doi.org/10.1166/nnl.2012.1367
Publication status	Published - Jun 2012
Externally published	Yes

Keywords

Antiferromagnetic coupling
Magnetic force microscopy
Perpendicular magnetic anisotropy

ASJC Scopus subject areas

General Materials Science

Access to Document

10.1166/nnl.2012.1367

Cite this

@article{90421c540d88449ebc30360192985d6d,

title = "Advanced magnetic force microscopy for high resolution magnetic imaging",

abstract = "Magnetic force microscopy (MFM) is one of the primary imaging tools for studying magnetic nanostructures. The resolution of MFM has been considered as a main issue in characterizing magnetic nanostructures smaller than 30 nm; especially for high density recording media beyond 1 Tbit/in2. In this letter, we investigated three different kinds of MFM tips such as those with a perpendicular magnetic anisotropy (PMA) derived from a crystallographic texture, antiferromagnetic coupled perpendicular (AFC) tips and tips with no crystallographic textures, resulting in no PMA. Their resolution, as measured using a recording media with written information, was compared with that of commercial MFM tips. The tip in the PMA configuration was found to provide the best resolution among all of them.",

keywords = "Antiferromagnetic coupling, Magnetic force microscopy, Perpendicular magnetic anisotropy",

author = "M. Ranjbar and Piramanayagam, {S. N.} and R. Sbiaa and Chong, {T. C.} and I. Okamoto",

year = "2012",

month = jun,

doi = "10.1166/nnl.2012.1367",

language = "English",

volume = "4",

pages = "628--633",

journal = "Nanoscience and Nanotechnology Letters",

issn = "1941-4900",

publisher = "American Scientific Publishers",

number = "6",

}

TY - JOUR

T1 - Advanced magnetic force microscopy for high resolution magnetic imaging

AU - Ranjbar, M.

AU - Piramanayagam, S. N.

AU - Sbiaa, R.

AU - Chong, T. C.

AU - Okamoto, I.

PY - 2012/6

Y1 - 2012/6

N2 - Magnetic force microscopy (MFM) is one of the primary imaging tools for studying magnetic nanostructures. The resolution of MFM has been considered as a main issue in characterizing magnetic nanostructures smaller than 30 nm; especially for high density recording media beyond 1 Tbit/in2. In this letter, we investigated three different kinds of MFM tips such as those with a perpendicular magnetic anisotropy (PMA) derived from a crystallographic texture, antiferromagnetic coupled perpendicular (AFC) tips and tips with no crystallographic textures, resulting in no PMA. Their resolution, as measured using a recording media with written information, was compared with that of commercial MFM tips. The tip in the PMA configuration was found to provide the best resolution among all of them.

AB - Magnetic force microscopy (MFM) is one of the primary imaging tools for studying magnetic nanostructures. The resolution of MFM has been considered as a main issue in characterizing magnetic nanostructures smaller than 30 nm; especially for high density recording media beyond 1 Tbit/in2. In this letter, we investigated three different kinds of MFM tips such as those with a perpendicular magnetic anisotropy (PMA) derived from a crystallographic texture, antiferromagnetic coupled perpendicular (AFC) tips and tips with no crystallographic textures, resulting in no PMA. Their resolution, as measured using a recording media with written information, was compared with that of commercial MFM tips. The tip in the PMA configuration was found to provide the best resolution among all of them.

KW - Antiferromagnetic coupling

KW - Magnetic force microscopy

KW - Perpendicular magnetic anisotropy

UR - http://www.scopus.com/inward/record.url?scp=84864841526&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84864841526&partnerID=8YFLogxK

U2 - 10.1166/nnl.2012.1367

DO - 10.1166/nnl.2012.1367

M3 - Article

AN - SCOPUS:84864841526

SN - 1941-4900

VL - 4

SP - 628

EP - 633

JO - Nanoscience and Nanotechnology Letters

JF - Nanoscience and Nanotechnology Letters

IS - 6

ER -

Advanced magnetic force microscopy for high resolution magnetic imaging

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this