Advanced magnetic force microscopy for high resolution magnetic imaging

M. Ranjbar, S. N. Piramanayagam*, R. Sbiaa, T. C. Chong, I. Okamoto

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

Magnetic force microscopy (MFM) is one of the primary imaging tools for studying magnetic nanostructures. The resolution of MFM has been considered as a main issue in characterizing magnetic nanostructures smaller than 30 nm; especially for high density recording media beyond 1 Tbit/in2. In this letter, we investigated three different kinds of MFM tips such as those with a perpendicular magnetic anisotropy (PMA) derived from a crystallographic texture, antiferromagnetic coupled perpendicular (AFC) tips and tips with no crystallographic textures, resulting in no PMA. Their resolution, as measured using a recording media with written information, was compared with that of commercial MFM tips. The tip in the PMA configuration was found to provide the best resolution among all of them.

Original languageEnglish
Pages (from-to)628-633
Number of pages6
JournalNanoscience and Nanotechnology Letters
Volume4
Issue number6
DOIs
Publication statusPublished - Jun 2012

Keywords

  • Antiferromagnetic coupling
  • Magnetic force microscopy
  • Perpendicular magnetic anisotropy

ASJC Scopus subject areas

  • Materials Science(all)

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